First application of Cc-corrected imaging for high-resolution and energy-filtered TEM

Contrast-transfer calculations indicate that Cc correction should be highly beneficial for high-resolution and energy-filtered transmission electron microscopy. A prototype of an electron optical system capable of correcting spherical and chromatic aberration has been used to verify these calculatio...

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Published in:Journal of electron microscopy 2009-06, Vol.58 (3), p.147-155
Main Authors: Kabius, Bernd, Hartel, Peter, Haider, Maximilian, Müller, Heiko, Uhlemann, Stephan, Loebau, Ulrich, Zach, Joachim, Rose, Harald
Format: Article
Language:English
Subjects:
aberration correction
chromatic aberration
EFTEM
HRTEM
oxides
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cited_by cdi_FETCH-LOGICAL-c343t-538f4e57a15e17ab27721da7d671280573eb83979582bc46bb2c2b6d92c1ab973
cites cdi_FETCH-LOGICAL-c343t-538f4e57a15e17ab27721da7d671280573eb83979582bc46bb2c2b6d92c1ab973
container_end_page 155
container_issue 3
container_start_page 147
container_title Journal of electron microscopy
container_volume 58
creator Kabius, Bernd
Hartel, Peter
Haider, Maximilian
Müller, Heiko
Uhlemann, Stephan
Loebau, Ulrich
Zach, Joachim
Rose, Harald
description Contrast-transfer calculations indicate that Cc correction should be highly beneficial for high-resolution and energy-filtered transmission electron microscopy. A prototype of an electron optical system capable of correcting spherical and chromatic aberration has been used to verify these calculations. A strong improvement in resolution at an acceleration voltage of 80 kV has been measured. Our first Cc-corrected energy-filtered experiments examining a (LaAlO3)0.3(Sr2AlTaO6)0.7/LaCoO3 interface demonstrated a significant gain for the spatial resolution in elemental maps of La.
doi_str_mv 10.1093/jmicro/dfp021
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fullrecord <record><control><sourceid>proquest_cross</sourceid><recordid>TN_cdi_proquest_miscellaneous_34750886</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><oup_id>10.1093/jmicro/dfp021</oup_id><sourcerecordid>34750886</sourcerecordid><originalsourceid>FETCH-LOGICAL-c343t-538f4e57a15e17ab27721da7d671280573eb83979582bc46bb2c2b6d92c1ab973</originalsourceid><addsrcrecordid>eNqF0DtPwzAUhmELgaBcRlaUCbEYfEly7BGqlotAMIBALJbjOMWQxsFOJPj3BFLByOTl0XfkF6F9So4pkfzkdelM8Cdl1RJG19CEpgBYSpGvowkhjGECabqFtmN8JYRCSskm2qKSSwGCTtDD3IXYJbpta2d053yT-CqZGmx8CNZ0tkzcUi9cs0gqH5IXt3jBwUZf9z9WN2ViGxsWn7hydWfD4O9nN7too9J1tHurd2e4M7ufXuDr2_PL6ek1NjzlHc64qFKbgaaZpaALBsBoqaHMgTJBMuC2EFyCzAQrTJoXBTOsyEvJDNWFBL6DDsfdNvj33sZOLV00tq51Y30fFU8hI0LkA8QjHFrFGGyl2jD8K3wqStR3RzV2VGPHwR-shvtiacs_vQo3gKMR-L79d2t128XOfvxiHd5UDhwydfH0rK7g8U6e3czVnH8BRpSNOA</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>34750886</pqid></control><display><type>article</type><title>First application of Cc-corrected imaging for high-resolution and energy-filtered TEM</title><source>Oxford Journals Online</source><creator>Kabius, Bernd ; Hartel, Peter ; Haider, Maximilian ; Müller, Heiko ; Uhlemann, Stephan ; Loebau, Ulrich ; Zach, Joachim ; Rose, Harald</creator><creatorcontrib>Kabius, Bernd ; Hartel, Peter ; Haider, Maximilian ; Müller, Heiko ; Uhlemann, Stephan ; Loebau, Ulrich ; Zach, Joachim ; Rose, Harald</creatorcontrib><description>Contrast-transfer calculations indicate that Cc correction should be highly beneficial for high-resolution and energy-filtered transmission electron microscopy. A prototype of an electron optical system capable of correcting spherical and chromatic aberration has been used to verify these calculations. A strong improvement in resolution at an acceleration voltage of 80 kV has been measured. Our first Cc-corrected energy-filtered experiments examining a (LaAlO3)0.3(Sr2AlTaO6)0.7/LaCoO3 interface demonstrated a significant gain for the spatial resolution in elemental maps of La.</description><identifier>ISSN: 0022-0744</identifier><identifier>EISSN: 1477-9986</identifier><identifier>DOI: 10.1093/jmicro/dfp021</identifier><identifier>PMID: 19398781</identifier><language>eng</language><publisher>Japan: Oxford University Press</publisher><subject>aberration correction ; chromatic aberration ; EFTEM ; HRTEM ; oxides</subject><ispartof>Journal of electron microscopy, 2009-06, Vol.58 (3), p.147-155</ispartof><rights>Oxford University Press © The Author 2009. Published by Oxford University Press on behalf of Japanese Society of Microscopy. All rights reserved. For permissions, please e-mail: journals.permissions@oxfordjournals.org 2009</rights><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c343t-538f4e57a15e17ab27721da7d671280573eb83979582bc46bb2c2b6d92c1ab973</citedby><cites>FETCH-LOGICAL-c343t-538f4e57a15e17ab27721da7d671280573eb83979582bc46bb2c2b6d92c1ab973</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>314,780,784,27924,27925</link.rule.ids><backlink>$$Uhttps://www.ncbi.nlm.nih.gov/pubmed/19398781$$D View this record in MEDLINE/PubMed$$Hfree_for_read</backlink></links><search><creatorcontrib>Kabius, Bernd</creatorcontrib><creatorcontrib>Hartel, Peter</creatorcontrib><creatorcontrib>Haider, Maximilian</creatorcontrib><creatorcontrib>Müller, Heiko</creatorcontrib><creatorcontrib>Uhlemann, Stephan</creatorcontrib><creatorcontrib>Loebau, Ulrich</creatorcontrib><creatorcontrib>Zach, Joachim</creatorcontrib><creatorcontrib>Rose, Harald</creatorcontrib><title>First application of Cc-corrected imaging for high-resolution and energy-filtered TEM</title><title>Journal of electron microscopy</title><addtitle>J Electron Microsc</addtitle><addtitle>J Electron Microsc</addtitle><description>Contrast-transfer calculations indicate that Cc correction should be highly beneficial for high-resolution and energy-filtered transmission electron microscopy. A prototype of an electron optical system capable of correcting spherical and chromatic aberration has been used to verify these calculations. A strong improvement in resolution at an acceleration voltage of 80 kV has been measured. Our first Cc-corrected energy-filtered experiments examining a (LaAlO3)0.3(Sr2AlTaO6)0.7/LaCoO3 interface demonstrated a significant gain for the spatial resolution in elemental maps of La.</description><subject>aberration correction</subject><subject>chromatic aberration</subject><subject>EFTEM</subject><subject>HRTEM</subject><subject>oxides</subject><issn>0022-0744</issn><issn>1477-9986</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2009</creationdate><recordtype>article</recordtype><recordid>eNqF0DtPwzAUhmELgaBcRlaUCbEYfEly7BGqlotAMIBALJbjOMWQxsFOJPj3BFLByOTl0XfkF6F9So4pkfzkdelM8Cdl1RJG19CEpgBYSpGvowkhjGECabqFtmN8JYRCSskm2qKSSwGCTtDD3IXYJbpta2d053yT-CqZGmx8CNZ0tkzcUi9cs0gqH5IXt3jBwUZf9z9WN2ViGxsWn7hydWfD4O9nN7too9J1tHurd2e4M7ufXuDr2_PL6ek1NjzlHc64qFKbgaaZpaALBsBoqaHMgTJBMuC2EFyCzAQrTJoXBTOsyEvJDNWFBL6DDsfdNvj33sZOLV00tq51Y30fFU8hI0LkA8QjHFrFGGyl2jD8K3wqStR3RzV2VGPHwR-shvtiacs_vQo3gKMR-L79d2t128XOfvxiHd5UDhwydfH0rK7g8U6e3czVnH8BRpSNOA</recordid><startdate>200906</startdate><enddate>200906</enddate><creator>Kabius, Bernd</creator><creator>Hartel, Peter</creator><creator>Haider, Maximilian</creator><creator>Müller, Heiko</creator><creator>Uhlemann, Stephan</creator><creator>Loebau, Ulrich</creator><creator>Zach, Joachim</creator><creator>Rose, Harald</creator><general>Oxford University Press</general><scope>BSCLL</scope><scope>NPM</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7U5</scope><scope>8FD</scope><scope>L7M</scope></search><sort><creationdate>200906</creationdate><title>First application of Cc-corrected imaging for high-resolution and energy-filtered TEM</title><author>Kabius, Bernd ; Hartel, Peter ; Haider, Maximilian ; Müller, Heiko ; Uhlemann, Stephan ; Loebau, Ulrich ; Zach, Joachim ; Rose, Harald</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c343t-538f4e57a15e17ab27721da7d671280573eb83979582bc46bb2c2b6d92c1ab973</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2009</creationdate><topic>aberration correction</topic><topic>chromatic aberration</topic><topic>EFTEM</topic><topic>HRTEM</topic><topic>oxides</topic><toplevel>online_resources</toplevel><creatorcontrib>Kabius, Bernd</creatorcontrib><creatorcontrib>Hartel, Peter</creatorcontrib><creatorcontrib>Haider, Maximilian</creatorcontrib><creatorcontrib>Müller, Heiko</creatorcontrib><creatorcontrib>Uhlemann, Stephan</creatorcontrib><creatorcontrib>Loebau, Ulrich</creatorcontrib><creatorcontrib>Zach, Joachim</creatorcontrib><creatorcontrib>Rose, Harald</creatorcontrib><collection>Istex</collection><collection>PubMed</collection><collection>CrossRef</collection><collection>Solid State and Superconductivity Abstracts</collection><collection>Technology Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><jtitle>Journal of electron microscopy</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Kabius, Bernd</au><au>Hartel, Peter</au><au>Haider, Maximilian</au><au>Müller, Heiko</au><au>Uhlemann, Stephan</au><au>Loebau, Ulrich</au><au>Zach, Joachim</au><au>Rose, Harald</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>First application of Cc-corrected imaging for high-resolution and energy-filtered TEM</atitle><jtitle>Journal of electron microscopy</jtitle><stitle>J Electron Microsc</stitle><addtitle>J Electron Microsc</addtitle><date>2009-06</date><risdate>2009</risdate><volume>58</volume><issue>3</issue><spage>147</spage><epage>155</epage><pages>147-155</pages><issn>0022-0744</issn><eissn>1477-9986</eissn><abstract>Contrast-transfer calculations indicate that Cc correction should be highly beneficial for high-resolution and energy-filtered transmission electron microscopy. A prototype of an electron optical system capable of correcting spherical and chromatic aberration has been used to verify these calculations. A strong improvement in resolution at an acceleration voltage of 80 kV has been measured. Our first Cc-corrected energy-filtered experiments examining a (LaAlO3)0.3(Sr2AlTaO6)0.7/LaCoO3 interface demonstrated a significant gain for the spatial resolution in elemental maps of La.</abstract><cop>Japan</cop><pub>Oxford University Press</pub><pmid>19398781</pmid><doi>10.1093/jmicro/dfp021</doi><tpages>9</tpages></addata></record>
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1477-9986
language eng
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subjects aberration correction
chromatic aberration
EFTEM
HRTEM
oxides
title First application of Cc-corrected imaging for high-resolution and energy-filtered TEM
url http://sfxeu10.hosted.exlibrisgroup.com/loughborough?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2024-12-28T10%3A30%3A40IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_cross&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=First%20application%20of%20Cc-corrected%20imaging%20for%20high-resolution%20and%20energy-filtered%20TEM&rft.jtitle=Journal%20of%20electron%20microscopy&rft.au=Kabius,%20Bernd&rft.date=2009-06&rft.volume=58&rft.issue=3&rft.spage=147&rft.epage=155&rft.pages=147-155&rft.issn=0022-0744&rft.eissn=1477-9986&rft_id=info:doi/10.1093/jmicro/dfp021&rft_dat=%3Cproquest_cross%3E34750886%3C/proquest_cross%3E%3Cgrp_id%3Ecdi_FETCH-LOGICAL-c343t-538f4e57a15e17ab27721da7d671280573eb83979582bc46bb2c2b6d92c1ab973%3C/grp_id%3E%3Coa%3E%3C/oa%3E%3Curl%3E%3C/url%3E&rft_id=info:oai/&rft_pqid=34750886&rft_id=info:pmid/19398781&rft_oup_id=10.1093/jmicro/dfp021&rfr_iscdi=true