Morphological evolution of films composed of energetic and size-selected silver nanocluster ions

In this study, morphologies of as-deposited and rapid thermal annealed films of silver nanoclusters are studied using scanning electron microscope (SEM) and atomic force microscope (AFM). Size-selected silver nanoclusters, containing 5000 atoms in a cluster, produced by the gas condensation method a...

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Bibliographic Details
Published in:Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms Beam interactions with materials and atoms, 2009-05, Vol.267 (8-9), p.1432-1435
Main Authors: Bhattacharyya, S.R., Datta, D., Chini, T.K., Ghose, D., Shyjumon, I., Hippler, R.
Format: Article
Language:English
Subjects:
Cluster flattening
Metal nanocluster
Morphology
Rapid thermal annealing (RTA)
Scanning electron microscopy
Supported clusters
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Summary:In this study, morphologies of as-deposited and rapid thermal annealed films of silver nanoclusters are studied using scanning electron microscope (SEM) and atomic force microscope (AFM). Size-selected silver nanoclusters, containing 5000 atoms in a cluster, produced by the gas condensation method are deposited on Si substrate for a period of 8min. In order to get an idea about the melting of clusters, the film is treated by rapid thermal annealing at 200 and 400°C. The remarkable changes of morphology due to annealing signify a lowering of melting temperature of silver in the form of nanoscale particles.
ISSN:0168-583X
1872-9584
DOI:10.1016/j.nimb.2009.01.124