Reliability analysis and utilization of PEMs in space application

More and more plastic encapsulated microcircuits (PEMs) are used in space missions to achieve high performance. Since PEMs are designed for use in terrestrial operating conditions, the successful usage of PEMs in space harsh environment is closely related to reliability issues, which should be consi...

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Bibliographic Details
Published in:Acta astronautica 2009-11, Vol.65 (9), p.1500-1505
Main Authors: Jiang, Xiujie, Wang, Zhihua, Sun, Huixian, Chen, Xiaomin, Zhao, Tianlin, Yu, Guanghua, Zhou, Changyi
Format: Article
Language:English
Subjects:
Double-Star Project
PEMs
Radiation
Reliability
Screening
Space application
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Summary:More and more plastic encapsulated microcircuits (PEMs) are used in space missions to achieve high performance. Since PEMs are designed for use in terrestrial operating conditions, the successful usage of PEMs in space harsh environment is closely related to reliability issues, which should be considered firstly. However, there is no ready-made methodology for PEMs in space applications. This paper discusses the reliability for the usage of PEMs in space. This reliability analysis can be divided into five categories: radiation test, radiation hardness, screening test, reliability calculation and reliability assessment. One case study is also presented to illuminate the details of the process, in which a PEM part is used in a joint space program Double-Star Project between the European Space Agency (ESA) and China. The influence of environmental constrains including radiation, humidity, temperature and mechanics on the PEM part has been considered. Both Double-Star Project satellites are still running well in space now.
ISSN:0094-5765
1879-2030
DOI:10.1016/j.actaastro.2009.03.085