Construction and Test of Low Cost X-Ray Tomography Scanner for Physical-Chemical Analysis and Nondestructive Inspections

X-ray computed tomography (CT) refers to the cross-sectional imaging of an object measuring the transmitted radiation at different directions. In this work, we describe the development of a low cost micro-CT X-ray scanner that is being developed for nondestructive testing. This tomograph operates us...

Full description

Saved in:
Bibliographic Details
Published in:AIP conference proceedings 2008-09, Vol.1139, p.102-105
Main Authors: De Oliveira Jr, Jose Martins, Martins, Antonio Cesar Germano
Format: Article
Language:English
Online Access:Get full text
Tags: Add Tag
No Tags, Be the first to tag this record!
Description
Summary:X-ray computed tomography (CT) refers to the cross-sectional imaging of an object measuring the transmitted radiation at different directions. In this work, we describe the development of a low cost micro-CT X-ray scanner that is being developed for nondestructive testing. This tomograph operates using a microfocus X-ray source and contains a silicon photodiode as detectors. The performance of the system, by its spatial resolution, has been estimated through its Modulation Transfer Function - MTF and the obtained value at 10% of MTF is 661mum. It was built as a general purpose nondestructive testing device.
ISSN:0094-243X