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Multi-analytical study of syntactic coalescence of polytypes in a 6H–SiC sample

X-ray diffraction topography (XRDT), using both synchrotron white-beam (SWBXT) and conventional MoKα 1 radiation, μ-Raman spectroscopy and transmission electron microscopy (TEM) were used to study a complex syntactic coalescence of polytypes in a PVT-grown 6H–SiC sample. The combined use of these te...

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Published in:Journal of crystal growth 2009-12, Vol.311 (23), p.4784-4790
Main Authors: Agrosì, G., Tempesta, G., Capitani, G.C., Scandale, E., Siche, D.
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Language:English
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cited_by cdi_FETCH-LOGICAL-c406t-334ddb24f19a42446421f26014c4f9dec3d8daec2a6dbba6ddfb1f17dd6ea9033
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container_issue 23
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description X-ray diffraction topography (XRDT), using both synchrotron white-beam (SWBXT) and conventional MoKα 1 radiation, μ-Raman spectroscopy and transmission electron microscopy (TEM) were used to study a complex syntactic coalescence of polytypes in a PVT-grown 6H–SiC sample. The combined use of these techniques has proven to be well suited to determine twin-related lamellae of polytype 15R. Each single technique used here was not fully adequate to establish the polytypic nature and the geometric relationship between the lamellae of foreign polytypes and the surrounding crystal bulk. X-ray diffraction topographies showing the whole slice, enabled the location of three lamellae: one lamella, labelled L 1, and two micro-lamellae L 2 and L 3. Lamella L 3 was enclosed in L 1. The diffraction contrast analyses and the μ-Raman spectra indicated that the L 1 and L 2 lamellae were exactly iso-oriented and both consisted of the 15R polytype, whereas the polytype of the L 3 lamella could not be clearly determined. Transmission electron microscopy (TEM) enabled a more thorough investigation of the actual polytype of this lamella. TEM analyses were carried out on a small fragment embedding the L 3 lamella and these indicated that L 3 was a 15R polytype which was twin-related by a rotation of 180° about the [0 0 0 1] axis with a (0 0 0 1) compositional plane.
doi_str_mv 10.1016/j.jcrysgro.2009.09.010
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subjects A1. Characterization
A1. Defect distribution
A1. Transmission electron microscopy
A1. X-ray diffraction topography
B2. Semiconducting silicon compounds
Coalescing
Condensed matter: structure, mechanical and thermal properties
Diffraction
Electron microscopy
Exact sciences and technology
Lamella
Physics
Polytypes
Structure and morphology
thickness
Surfaces and interfaces
thin films and whiskers (structure and nonelectronic properties)
Thin film structure and morphology
Topography
Transmission electron microscopy
X-rays
title Multi-analytical study of syntactic coalescence of polytypes in a 6H–SiC sample
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