Analog Automatic Test Pattern Generation for Quasi-Static Structural Test

A new approach for structural, fault-oriented analog test generation methodology to test for the presence of manufacturing-related defects is proposed. The output of the test generator consists of optimized test stimuli, fault coverage and sampling instants that are sufficient to detect the failure...

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Bibliographic Details
Published in:IEEE transactions on very large scale integration (VLSI) systems 2009-10, Vol.17 (10), p.1383-1391
Main Authors: Zjajo, A., de Gyvez, J.P.
Format: Article
Language:English
Subjects:
Analog ATPG
Analog circuits
analog test
Applied sciences
Automatic test pattern generation
Automatic testing
Circuit faults
Circuit properties
Circuit testing
Circuits
Electric, optical and optoelectronic circuits
Electrical fault detection
Electronic circuits
Electronics
Exact sciences and technology
Fault detection
Faults
Generators
Manufacturing
parametric fault model
Pattern generation
Probability
Sampling
Sampling methods
Signal convertors
Stimuli
structural test
Testability
Testing, measurement, noise and reliability
Very large scale integration
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Description
Summary:A new approach for structural, fault-oriented analog test generation methodology to test for the presence of manufacturing-related defects is proposed. The output of the test generator consists of optimized test stimuli, fault coverage and sampling instants that are sufficient to detect the failure modes in the circuit under test. The tests are generated and evaluated on a multistep ADC taking into account the potential fault masking effects of process spread on the faulty circuit responses. Similarly, the test generator results offer indication for the circuit partitioning within the framework of circuit performance, area and testability.
ISSN:1063-8210
1557-9999
DOI:10.1109/TVLSI.2008.2003517