Relaxation properties of persistent current in YBCO-coated conductors

The relaxation properties were investigated for PLD processed YBCO coated conductors deposited on IBAD substrates in the region of 0.25–1.50 μm for the thickness of superconducting layer to clarify the thickness dependence of the relaxation of magnetization. The apparent pinning potential U 0 ∗ was...

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Bibliographic Details
Published in:Physica. C, Superconductivity Superconductivity, 2008-09, Vol.468 (15), p.1674-1678
Main Authors: Himeki, K., Kiuchi, M., Otabe, E.S., Matsushita, T., Miyata, S., Ibi, A., Yamada, Y., Shiohara, Y.
Format: Article
Language:English
Subjects:
COATINGS
Condensed matter: electronic structure, electrical, magnetic, and optical properties
Conductors
COPPER OXIDE
Critical currents
DEPOSITION
DETERIORATION
ELECTRICAL CONDUCTORS
Exact sciences and technology
Flux creep-flow model
Flux pinning
formula omitted
Magnetization
Physics
PINNING
Properties of type I and type II superconductors
Relaxation
SUPERCONDUCTIVITY
SUPERCONDUCTORS
Thickness
Vortex lattices ,flux pinning, flux creep
YBCO
YBCO superconductors
YTTRIUM OXIDE
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Summary:The relaxation properties were investigated for PLD processed YBCO coated conductors deposited on IBAD substrates in the region of 0.25–1.50 μm for the thickness of superconducting layer to clarify the thickness dependence of the relaxation of magnetization. The apparent pinning potential U 0 ∗ was estimated from the relaxation rate. It was found that U 0 ∗ increases with increasing temperature in the low temperature region. The weak thickness dependence of U 0 ∗ in this temperature region comes from the three-dimensional flux pinning mechanism. Then, U 0 ∗ has a peak followed by a decrease with increasing temperature. The peak value of U 0 ∗ increases with increasing thickness. Hence, the thicker superconductor is more advantageous for applications in the middle temperature range and higher. The flux pinning mechanism in the medium and higher temperature region is two-dimensional and the larger U 0 ∗ value in the thicker specimen originates mainly from the thickness. For the improvement of U 0 ∗ in the low temperature region, it is required to enhance the flux pinning strength and to increase the thickness without deterioration in the critical current density.
ISSN:0921-4534
1873-2143
DOI:10.1016/j.physc.2008.05.173