The use of X-ray diffraction to determine slip and twinning activity in commercial-purity (CP) titanium

• Published in: Materials science & engineering. A, Structural materials : properties, microstructure and processing Structural materials : properties, microstructure and processing, 2008-10, Vol.493 (1), p.79-85
• Main Authors: Ungár, T., Glavicic, M.G., Balogh, L., Nyilas, K., Salem, A.A., Ribárik, G., Semiatin, S.L.
• Format: Article
• Language: English
• Subjects: Applied sciences; Cross-disciplinary physics: materials science; rheology; Dislocation density; Exact sciences and technology; Forming; Materials science; Metals. Metallurgy; Other heat and thermomechanical treatments; Physics; Production techniques; Rolling; Slip activity; Titanium; Treatment of materials and its effects on microstructure and properties; Twinning; X-ray line profile analysis
• ISSN: 0921-5093; 1873-4936
• DOI: 10.1016/j.msea.2007.06.096

High-resolution X-ray diffraction (XRD) line-profile analysis was used to characterize slip activity and twinning in commercial-purity titanium (CP-Ti) during hot rolling. The effect of {10.1} and {10.2} twins on XRD patterns was deduced using the DIFFAX software. The density of twin boundaries was then incorporated into the XRD pattern-fitting procedure for evaluating dislocation densities, slip activity, and subgrain size. It was found that 〈 a〉 and 〈 c + a〉 type slip occurred during hot rolling. The X-ray data revealed 0.07(±0.02)% twin-boundary frequency for the {10.2} twin family, but zero twinning (within the experimental accuracy) in the {10.1} family. Electron backscatter diffraction (EBSD) data confirmed the X-ray findings.