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Characterization of environmental nanoparticles
In this study, we attempted to characterize environmental nanoparticles and particle diameter distributions in the atmospheric environment neighboring a traffic route by using a scanning mobility particle sizer (SMPS). The composition of the environmental nanoparticles was analyzed using time-of-fli...
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Published in: | Applied surface science 2008-12, Vol.255 (4), p.1538-1540 |
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Main Authors: | , , , |
Format: | Article |
Language: | English |
Subjects: | |
Citations: | Items that this one cites Items that cite this one |
Online Access: | Get full text |
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Summary: | In this study, we attempted to characterize environmental nanoparticles and particle diameter distributions in the atmospheric environment neighboring a traffic route by using a scanning mobility particle sizer (SMPS). The composition of the environmental nanoparticles was analyzed using time-of-flight secondary ion mass spectrometry (TOF-SIMS). It was observed that the environmental nanoparticles showed peaks at 20
nm and 100
nm. The secondary ions C
+, O
+, Si
+, and SiH
3
+ were strongly detected in the environmental nanoparticles with a peak at 20
nm. On the other hand, the secondary ions NH
4
+, Na
+, K
+, and Ca
+ were detected in the environmental nanoparticles with a peak at 100
nm. Moreover, it was found that the secondary ion spectral patterns of the organic compounds were different for each particle diameter. Hence, we concluded that the combination of the SMPS with TOF-SIMS is a powerful technique to characterize environmental nanoparticles. |
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ISSN: | 0169-4332 1873-5584 |
DOI: | 10.1016/j.apsusc.2008.05.013 |