MORFOLOGICAL AND STRUCTURAL CHARACTERISTICS OF II-VI SEMICONDUCTOR THIN FILMS (ZnTe, CdTe, ZnS)

The surface morphology and microstructural characteristic of ZnTe, CdTe and ZnS thin films obtained by close-spaced sublimation technique were investigated. The structural features of layers were examined by XRD, SEM and optical microscopy. Size of coherent scattering regions, lattice microstrain an...

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Bibliographic Details
Published in:Integrated ferroelectrics 2008-01, Vol.103 (1), p.32-40
Main Authors: KURBATOV, D., KOSYAK, V., KOLESNYK, M., OPANASYUK, A., DANILCHENKO, S.
Format: Article
Language:English
Subjects:
closed space sublimation (CSS)
crystal structure
II-VI semiconductor compounds
lattice defects
thin films
x-ray diffraction (XRD)
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Summary:The surface morphology and microstructural characteristic of ZnTe, CdTe and ZnS thin films obtained by close-spaced sublimation technique were investigated. The structural features of layers were examined by XRD, SEM and optical microscopy. Size of coherent scattering regions, lattice microstrain and stacking fault defect concentration were estimated from X-ray diffraction line broadening. The investigation performed elucidates effect of preparation conditions on main structural characteristics of ZnTe, CdTe and ZnS thin films.
ISSN:1058-4587
1607-8489
DOI:10.1080/10584580802558126