Surface Potential Imaging of Solution Processable Acene-Based Thin Film Transistors

Scanning Kelvin probe microscopy (SKPM) of functioning solution processed thin film transistors is used to correlate film microstructure with device performance. As the channel length increases in these spun–cast devices, significant changes occur in the film microstructure within the device channel...

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Bibliographic Details
Published in:Advanced materials (Weinheim) 2008-12, Vol.20 (23), p.4513-4516
Main Authors: Teague, Lucile C., Hamadani, Behrang H., Jurchescu, Oana D., Subramanian, Sankar, Anthony, John E., Jackson, Thomas N., Richter, Curt A., Gundlach, David J., Kushmerick, James G.
Format: Article
Language:English
Subjects:
charge transport
field-effect transistors
organic
scanning kelvin probe microscopy
semiconductors
solution processing
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Summary:Scanning Kelvin probe microscopy (SKPM) of functioning solution processed thin film transistors is used to correlate film microstructure with device performance. As the channel length increases in these spun–cast devices, significant changes occur in the film microstructure within the device channel. These changes are observed with SKPM, and show a strong structure–function relationship.
ISSN:0935-9648
1521-4095
DOI:10.1002/adma.200801780