Surface Potential Imaging of Solution Processable Acene-Based Thin Film Transistors

Scanning Kelvin probe microscopy (SKPM) of functioning solution processed thin film transistors is used to correlate film microstructure with device performance. As the channel length increases in these spun–cast devices, significant changes occur in the film microstructure within the device channel...

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Published in:Advanced materials (Weinheim) 2008-12, Vol.20 (23), p.4513-4516
Main Authors: Teague, Lucile C., Hamadani, Behrang H., Jurchescu, Oana D., Subramanian, Sankar, Anthony, John E., Jackson, Thomas N., Richter, Curt A., Gundlach, David J., Kushmerick, James G.
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Language:English
Subjects:
charge transport
field-effect transistors
organic
scanning kelvin probe microscopy
semiconductors
solution processing
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cited_by cdi_FETCH-LOGICAL-c3580-ab497cb3e0080d053a4681a678ed9afc8440912303d7ebd1e09d8dec7af298e73
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creator Teague, Lucile C.
Hamadani, Behrang H.
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Jackson, Thomas N.
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Gundlach, David J.
Kushmerick, James G.
description Scanning Kelvin probe microscopy (SKPM) of functioning solution processed thin film transistors is used to correlate film microstructure with device performance. As the channel length increases in these spun–cast devices, significant changes occur in the film microstructure within the device channel. These changes are observed with SKPM, and show a strong structure–function relationship.
doi_str_mv 10.1002/adma.200801780
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source Wiley:Jisc Collections:Wiley Read and Publish Open Access 2024-2025 (reading list)
subjects charge transport
field-effect transistors
organic
scanning kelvin probe microscopy
semiconductors
solution processing
title Surface Potential Imaging of Solution Processable Acene-Based Thin Film Transistors
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