Data fusion of XPS and AFM images for chemical phase identification in polymer blends

In this study, multitechnique image fusion between imaging X‐ray photoelectron spectroscopy (XPS) and phase imaging atomic force microscopy (AFM) is discussed. It is beneficial for the purpose of facilitating correlation of different physical properties such as phase information from AFM images with...

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Bibliographic Details
Published in:Surface and interface analysis 2009-02, Vol.41 (2), p.119-126
Main Authors: Artyushkova, Kateryna, Farrar, Jabari O., Fulghum, Julia E.
Format: Article
Language:English
Subjects:
classification
image fusion
image registration
imaging XPS
multitechnique correlation
phase-contrast AFM
resolution merge
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Summary:In this study, multitechnique image fusion between imaging X‐ray photoelectron spectroscopy (XPS) and phase imaging atomic force microscopy (AFM) is discussed. It is beneficial for the purpose of facilitating correlation of different physical properties such as phase information from AFM images with chemical information from XPS images and enhancing spatial resolution by utilizing a nanometer spatial resolution of AFM images to enhance data from XPS images with spatial resolutions of microns. Small‐area‐imaging XPS is used to identify the phases observed through AFM for the data obtained from the same area on a sample. A patterned surface of polymer on indium tin oxide (ITO) is used to outline the procedure. The procedure is applied to poly(methyl methacrylate) (PMMA) and poly(vinyl chloride) PVC blends of various compositions. The phases are clearly identifiable in AFM images based on imaging XPS results. Resolution merge was also applied to multispectral XPS and AFM images acquired from polystyrene/polybutadiene blend. This type of image fusion allows for a direct visualization of overlap between chemical and topographical heterogeneities, which is critical in understanding material properties. Copyright © 2008 John Wiley & Sons, Ltd.
ISSN:0142-2421
1096-9918
DOI:10.1002/sia.2968