On correlation between fractal dimension and profilometric parameters in characterization of surface topographies

• Published in: Applied surface science 2009-01, Vol.255 (7), p.4283-4288
• Main Authors: Risović, D., Poljaček, S. Mahović, Gojo, M.
• Format: Article
• Language: English
• Subjects: Aluminium oxide; Electrochemical impedance spectroscopy; Fractal dimension; Printing plate; Profilometry; SEM; Surface roughness
• ISSN: 0169-4332; 1873-5584
• DOI: 10.1016/j.apsusc.2008.11.028

This study reports and discusses the results of investigation of correlation between fractal dimensions D EIS inferred from electrochemical impedance spectroscopy measurements and profilometric parameters obtained by contact (stylus) and non-contact (laser) profilometric methods. The research, conducted on two types of printing plates with different aluminium oxide surface topographies, revealed that there exists a good correlation between D EIS and certain profilometric parameters, although there are significant differences in values of roughness parameters inferred from stylus method in respect to these inferred from the non-contact measurements. The best correlation, regardless of the applied method or printing plate type, exists between D EIS and the average surface roughness parameter R a . Generally, better correlation between fractal dimension and profilometric parameters is observed for parameters inferred from contact measurements than for those obtained by non-contact (laser) methods. The correlations between fractal dimension D EIS, which is a very good descriptor of overall surface topography, and various profilometric parameters, provide significant information on the surface topography and an additional insight into processes responsible for its changes.