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Increased Rate of Multiple-Bit Upset From Neutrons at Large Angles of Incidence
Neutron interactions with terrestrial systems produce soft errors, increasing the failure-in-time (FIT) rate of advanced CMOS circuits. These neutron-induced errors are a critical reliability problem facing advanced technologies. This paper reports the accelerated neutron testing on a 90-nm CMOS SRA...
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| Published in: | IEEE transactions on device and materials reliability 2008-09, Vol.8 (3), p.565-570 |
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| Main Authors: | , , , , , , , , |
| Format: | Magazinearticle |
| Language: | English |
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| cited_by | cdi_FETCH-LOGICAL-c421t-a4cefdb7d72be1d8ee603096dada83afb4197bb15408d427ce611c832c90e9573 |
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| cites | cdi_FETCH-LOGICAL-c421t-a4cefdb7d72be1d8ee603096dada83afb4197bb15408d427ce611c832c90e9573 |
| container_end_page | 570 |
| container_issue | 3 |
| container_start_page | 565 |
| container_title | IEEE transactions on device and materials reliability |
| container_volume | 8 |
| creator | Tipton, A.D. Xiaowei Zhu Haixiao Weng Pellish, J.A. Fleming, P.R. Schrimpf, R.D. Reed, R.A. Weller, R.A. Mendenhall, M. |
| description | Neutron interactions with terrestrial systems produce soft errors, increasing the failure-in-time (FIT) rate of advanced CMOS circuits. These neutron-induced errors are a critical reliability problem facing advanced technologies. This paper reports the accelerated neutron testing on a 90-nm CMOS SRAM that exhibits an increased multiple-bit upset FIT rate from neutrons at large angles of incidence. The modeling of these data is used to predict the reliability of ground-based systems. |
| doi_str_mv | 10.1109/TDMR.2008.2002356 |
| format | magazinearticle |
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| ispartof | IEEE transactions on device and materials reliability, 2008-09, Vol.8 (3), p.565-570 |
| issn | 1530-4388 1558-2574 |
| language | eng |
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| source | IEEE Xplore (Online service) |
| subjects | Accelerated tests Angle of incidence Circuit testing Circuits CMOS CMOS technology Devices Error correction Incidence Life estimation Mathematical models Multiple-bit upset (MBU) NASA neutron Neutrons Predictive models Protons Random access memory Semiconductor device modeling soft error Soft errors |
| title | Increased Rate of Multiple-Bit Upset From Neutrons at Large Angles of Incidence |
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