Highly Accurate THz Time-Domain Spectroscopy of Multilayer Structures

We extract the optical material parameters of a layer within a multilayer sample from terahertz (THz) time-domain spectroscopy data. To this aim, we derive a suited transfer function for multilayer structures in general and use the recently introduced spatially variant moving average filter to impro...

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Bibliographic Details
Published in:IEEE journal of selected topics in quantum electronics 2008-03, Vol.14 (2), p.392-398
Main Authors: Wilk, R., Pupeza, I., Cernat, R., Koch, M.
Format: Article
Language:English
Subjects:
Algorithms
Frequency
Liquids
Multilayers
Nonhomogeneous media
Optical filters
Optical materials
Optical reflection
Quantum electronics
Signal processing
spatially variant moving average filter (SVMAF)
Spectroscopy
Submillimeter wave filters
TDS
terahertz
Time domain analysis
Transfer functions
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Summary:We extract the optical material parameters of a layer within a multilayer sample from terahertz (THz) time-domain spectroscopy data. To this aim, we derive a suited transfer function for multilayer structures in general and use the recently introduced spatially variant moving average filter to improve the accuracy of the algorithm. We demonstrate two applications of our method experimentally: the determination of the thickness and optical material parameters of an unknown layer on a substrate and the investigation of liquids in a known cuvette.
ISSN:1077-260X
1558-4542
DOI:10.1109/JSTQE.2007.910981