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Characterization of alkyl monolayer covalently bonded to Si(111) and soft-landing of vanadium-benzene sandwich clusters onto the alkyl monolayer substrate

A hexadecyl monolayer covalently attached to Si(111) surfaces (C 16 –Si(111)) was prepared at 200  ○ C from 1-hexadecene. Formation of the monolayer was characterized by water contact angle measurement, attenuated total reflection infrared (ATR-IR) spectroscopy, and X-ray photoelectron spectroscopy...

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Bibliographic Details
Published in:The European physical journal. D, Atomic, molecular and optical physics (Print) Atomic, molecular and optical physics (Print), 2009-04, Vol.52 (1-3), p.99-102
Main Authors: Matsumoto, T., Nagaoka, S., Ikemoto, K., Mitsui, M., Ara, M., Tada, H., Nakajima, A.
Format: Article
Language:English
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Summary:A hexadecyl monolayer covalently attached to Si(111) surfaces (C 16 –Si(111)) was prepared at 200  ○ C from 1-hexadecene. Formation of the monolayer was characterized by water contact angle measurement, attenuated total reflection infrared (ATR-IR) spectroscopy, and X-ray photoelectron spectroscopy (XPS). Gas phase synthesized vanadium (V)-benzene (Bz) 1:2 (VBz 2 ) sandwich clusters were size-selectively deposited onto the C 16 –Si(111) substrate thus prepared and an oxidized Si substrate. Investigation of the resultant clusters was implemented by thermal desorption spectroscopy (TDS). About 30 K increase in threshold desorption temperature of the landed clusters was observed on going from the oxidized Si to the C 16 –Si(111) substrate, a result indicating that the clusters are more strongly bound to the C 16 –Si(111) than to the oxidized Si. This result was explained by the penetration of the landed clusters into the hexadecyl monolayer.
ISSN:1434-6060
1434-6079
DOI:10.1140/epjd/e2009-00069-9