Exit wave reconstruction at atomic resolution

An iterative method for exit wave function reconstruction based on wave function propagation in free space is presented. The method, which has the potential for application to many forms of microscopy, has been tailored to work with a through focal series of images measured in a high-resolution tran...

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Bibliographic Details
Published in:Ultramicroscopy 2004-07, Vol.100 (1), p.91-104
Main Authors: Allen, L.J., McBride, W., O'Leary, N.L., Oxley, M.P.
Format: Article
Language:English
Subjects:
Crystallography
Exit wave reconstruction
Image Processing, Computer-Assisted - methods
Imaging, Three-Dimensional - methods
Microscopy, Electron
Microscopy, Phase-Contrast - methods
Models, Theoretical
Nanotechnology
Partial coherence
Phase retrieval
Transmission electron microscopy
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Summary:An iterative method for exit wave function reconstruction based on wave function propagation in free space is presented. The method, which has the potential for application to many forms of microscopy, has been tailored to work with a through focal series of images measured in a high-resolution transmission electron microscope. Practical difficulties for exit wave reconstruction which are pertinent in this experimental environment are the slight incoherence of the electron beam, sample drift and its effect upon the defocus step size that can be utilised, and the number of image measurements that need to be made. To gauge the effectiveness of the method it is applied to experimental data that has been analysed previously using a maximum likelihood formalism (the MAL method).
ISSN:0304-3991
1879-2723
DOI:10.1016/j.ultramic.2004.01.012