Direct evidence for atomic defects in graphene layers

Atomic-scale defects in graphene layers alter the physical and chemical properties of carbon nanostructures. Theoretical predictions have recently shown that energetic particles such as electrons and ions can induce polymorphic atomic defects in graphene layers as a result of knock-on atom displacem...

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Bibliographic Details
Published in:Nature 2004-08, Vol.430 (7002), p.870-873
Main Authors: Suenaga, Kazu, Hashimoto, Ayako, Gloter, Alexandre, Urita, Koki, Iijima, Sumio
Format: Article
Language:English
Subjects:
Atoms & subatomic particles
Carbon
Chemical properties
Condensed matter: structure, mechanical and thermal properties
Cross-disciplinary physics: materials science
rheology
Defects and impurities in crystals
microstructure
Exact sciences and technology
Experimental determination of defects by diffraction and scattering
Humanities and Social Sciences
letter
Materials science
multidisciplinary
Nanoscale materials and structures: fabrication and characterization
Nanotechnology
Nanotubes
Particle physics
Physics
Science
Science (multidisciplinary)
Structure of solids and liquids
crystallography
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Summary:Atomic-scale defects in graphene layers alter the physical and chemical properties of carbon nanostructures. Theoretical predictions have recently shown that energetic particles such as electrons and ions can induce polymorphic atomic defects in graphene layers as a result of knock-on atom displacements. However, the number of experimental reports on these defects is limited. The graphite network in single-walled carbon nanotubes has been visualized by transmission electron microscopy (TEM) and their chiral indices have been determined. But the methods used require a long image acquisition time and intensive numerical treatments after observations to find an 'average' image, which prevents the accurate detection and investigation of defect structures. Here we report observations in situ of defect formation in single graphene layers by high-resolution TEM. The observed structures are expected to be of use when engineering the properties of carbon nanostructures for specific device applications.
ISSN:0028-0836
1476-4687
DOI:10.1038/nature02817