Infrared Spectroscopy for Chemically Specific Sensing in Silicon-Based Microreactors

Fourier transform infrared (FT-IR) spectroscopy in a multiple internal reflection (MIR) geometry is integrated with silicon-based microreactors to allow detection of a wide range of chemical species while taking advantage of inexpensive batch fabrication techniques applicable to silicon substrates....

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Bibliographic Details
Published in:Analytical chemistry (Washington) 2004-11, Vol.76 (21), p.6476-6483
Main Authors: Herzig-Marx, Rachel, Queeney, K. T, Jackman, Rebecca J, Schmidt, Martin A, Jensen, Klavs F
Format: Article
Language:English
Subjects:
Analytical chemistry
Chemistry
Exact sciences and technology
Infrared radiation
Reactors
Sensors
Silicon
Spectrometric and optical methods
Spectrum analysis
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Summary:Fourier transform infrared (FT-IR) spectroscopy in a multiple internal reflection (MIR) geometry is integrated with silicon-based microreactors to allow detection of a wide range of chemical species while taking advantage of inexpensive batch fabrication techniques applicable to silicon substrates. The microreactors are fabricated in silicon and glass using standard microfabrication and selective etching techniques. The small (∼1 cm side) reactor size provides access to nearly the full mid-IR frequency region with MIR-FT-IR, allowing us to probe both solution-phase and surface-bound chemical transformations. The wide applicability of this approach is demonstrated with two representative test cases:  kinetics of acid-catalyzed ethyl acetate hydrolysis and amidization of surface-tethered amine groups.
ISSN:0003-2700
1520-6882
DOI:10.1021/ac049265c