Damage induced by low-energy electrons in solid films of tetrahydrofuran

• Published in: The Journal of chemical physics 2004-12, Vol.121 (22), p.11240-11249
• Main Authors: Breton, S-P, Michaud, M, Jäggle, C, Swiderek, P, Sanche, L
• Format: Article
• Language: English
• ISSN: 0021-9606; 1089-7690
• DOI: 10.1063/1.1814632

We report on the low-energy electron-induced production of aldehydes within thin solid films of tetrahydrofuran (THF) condensed on a solid Kr substrate. The aldehyde fragments, which remain trapped within the bulk of the THF film, are detected in situ via their 3,1(n-->pi*) and 3(pi-->pi*) electronic transitions and vibrational excitations in the ground state using high-resolution electron-energy-loss spectroscopy. The production of aldehyde is studied as a function of the electron exposure, film thickness, and incident electron energy between 1 and 18.5 eV. The aldehyde production is calibrated in terms of an electron scattering cross section, which is found to be typically 6-7 x 10(-17) cm(2) between 11 and 19 eV. Its energy dependence is characterized by a small feature around 3 eV, a strong rise from 6 eV up to a maximum at 12.5 eV, followed by two structures centered around 15 and 18 eV. The aldehyde production is discussed in terms of the formation of electron resonances or transient anion states, which may lead to the fragmentation of the molecule and explain the structures seen in the energy dependence of the measured cross section.