A High-Density Array of Size-Controlled Silicon Nanodots in a Silicon Oxide Nanowire by Electron-Stimulated Oxygen Expulsion

• Published in: Nano letters 2009-05, Vol.9 (5), p.1780-1786
• Main Authors: Park, Gyeong-Su, Lee, Eun Kyung, Lee, Jun Ho, Park, Juyeon, Kim, Seong Keun, Li, Xiang Shu, Park, Ju Cheol, Chung, Jae Gwan, Jeon, Woo Sung, Heo, Sung, Lee, Jae Hak, Choi, Byoung Lyong, Kim, Jong Min
• Format: Article
• Language: English
• Subjects: Applied sciences; Cross-disciplinary physics: materials science; rheology; Electronics; Energy; Exact sciences and technology; Materials science; Nanocrystalline materials; Nanoscale materials and structures: fabrication and characterization; Natural energy; Photovoltaic conversion; Physics; Quantum wires; Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices; Solar cells. Photoelectrochemical cells; Solar energy; Transistors
• ISSN: 1530-6984; 1530-6992
• DOI: 10.1021/nl803660m

Methods of producing Si nanodots embedded in films of silicon oxide and silicon nitride abound, but fabrication of Si nanodots in a nanowire of these materials is very rare despite the fact that nanowire architecture enhances the charge collection and transport efficiencies for solar cells and field-effect transistors. We report a novel fabrication method for a high-density array of size-controlled sillicon nanodots from a silicon oxide nanowire using electron-beam irradiation. Our results demonstrate that a highly dense phase of Si nanodots with a narrow size distribution can be made from a silicon oxide nanowire with a core−shell structure of crystalline silicon-rich oxide (c-SRO)/amorphous silicon oxide (a-SiO2). This new nanomaterial shows the carrier transport characteristics of a semiconductor. The initially produced amorphous Si nanodots can be readily turned into crystalline Si (c-Si) nanodots by thermal annealing. Key characteristics of c-Si nanodots such as their size, number density, and rate of nucleation and growth are easily controlled by varying the electron radiation dose and annealing temperature. Nanodot formation is mechanistically initiated by electron trapping at the c-SRO core as well as at the core−shell interface, which leads to out-diffusion of the negatively charged oxygen through Coulomb repulsion, fostering the aggregation of Si atoms.