Nanobits: customizable scanning probe tips

We present here a proof-of-principle study of scanning probe tips defined by planar nanolithography and integrated with AFM probes using nanomanipulation. The so-called 'nanobits' are 2-4 microm long and 120-150 nm thin flakes of Si(3)N(4) or SiO(2), fabricated by electron beam lithography...

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Bibliographic Details
Published in:Nanotechnology 2009-09, Vol.20 (39), p.395703-395703
Main Authors: Rajendra Kumar, R T, Hassan, S U, Sardan Sukas, O, Eichhorn, V, Krohs, F, Fatikow, S, Boggild, P
Format: Article
Language:English
Subjects:
Atomic force microscopy
Dislocations
Electron beam lithography
Nanocomposites
Nanomaterials
Nanostructure
Scanning
Tips
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Summary:We present here a proof-of-principle study of scanning probe tips defined by planar nanolithography and integrated with AFM probes using nanomanipulation. The so-called 'nanobits' are 2-4 microm long and 120-150 nm thin flakes of Si(3)N(4) or SiO(2), fabricated by electron beam lithography and standard silicon processing. Using a microgripper they were detached from an array and fixed to a standard pyramidal AFM probe or alternatively inserted into a tipless cantilever equipped with a narrow slit. The nanobit-enhanced probes were used for imaging of deep trenches, without visible deformation, wear or dislocation of the tips of the nanobit after several scans. This approach allows an unprecedented freedom in adapting the shape and size of scanning probe tips to the surface topology or to the specific application.
ISSN:0957-4484
1361-6528
DOI:10.1088/0957-4484/20/39/395703