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Accumulation of memory T cells from childhood to old age: Central and effector memory cells in CD4 + versus effector memory and terminally differentiated memory cells in CD8 + compartment
Memory T cells can be classified as central memory (T CM, CD45RA negCCR7 +), effector memory (T EM, CD45RA negCCR7 neg), and terminally differentiated cells (T TD, CD45RA +CCR7 neg) with different homing and effector capacities. In 101 healthy subjects aged from 5 to 96 years, distinct dynamics were...
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Published in: | Mechanisms of ageing and development 2006-03, Vol.127 (3), p.274-281 |
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Main Authors: | , , , , , |
Format: | Article |
Language: | English |
Subjects: | |
Citations: | Items that cite this one |
Online Access: | Get full text |
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Summary: | Memory T cells can be classified as central memory (T
CM, CD45RA
negCCR7
+), effector memory (T
EM, CD45RA
negCCR7
neg), and terminally differentiated cells (T
TD, CD45RA
+CCR7
neg) with different homing and effector capacities. In 101 healthy subjects aged from 5 to 96 years, distinct dynamics were evidenced between circulating CD4
+ and CD8
+ T cell populations. Naive CD4
+ and CD8
+ T cells decreased linearly with age, CD8
+ twice more rapidly. Memory cells outnumbered naive cells on average at 37.4 in the CD4
+ and 29.5 years of age in the CD8
+ pool. CD4
+ T
CM and T
EM cells were positively correlated and increased linearly at a similar rate with age, while CD4
+ T
TD remained rare. CD8
+ T
EM and T
TD accumulated linearly with age, while T
CM increased only slightly, and each memory subset was negatively correlated to the two others. Almost all CD8
+ T
TD and some CD8
+ T
EM had lost CD28 expression. Despite different dynamics, each individual CD4
+ naive and memory subset was correlated to the synonymous CD8
+ subset. Half of the subjects aged 65 years or older were characterized by extremely reduced CD8
+ naive and increased CD8
+ T
TD cell counts, which could indicate an acceleration of the decay of the immune system from this age onward. |
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ISSN: | 0047-6374 1872-6216 |
DOI: | 10.1016/j.mad.2005.11.001 |