Multiple time scales in diffraction measurements of diffusive surface relaxation

We grew SrTiO3 on SrTiO3(001) by pulsed laser deposition, using x-ray scattering to monitor the growth in real time. The time-resolved small-angle scattering exhibits a well-defined length scale associated with the spacing between unit-cell high surface features. This length scale imposes a discrete...

Full description

Saved in:
Bibliographic Details
Published in:Physical review letters 2006-02, Vol.96 (5), p.055508-055508
Main Authors: Fleet, Aaron, Dale, Darren, Woll, A R, Suzuki, Y, Brock, J D
Format: Article
Language:English
Subjects:
Fourier Analysis
Lasers
Microscopy, Atomic Force
Oxides - chemistry
Strontium - chemistry
Titanium - chemistry
X-Ray Diffraction
Online Access:Get full text
Tags: Add Tag
No Tags, Be the first to tag this record!
Description
Summary:We grew SrTiO3 on SrTiO3(001) by pulsed laser deposition, using x-ray scattering to monitor the growth in real time. The time-resolved small-angle scattering exhibits a well-defined length scale associated with the spacing between unit-cell high surface features. This length scale imposes a discrete spectrum of Fourier components and rate constants upon the diffusion equation solution, evident in multiple exponential relaxation of the "anti-Bragg" diffracted intensity. An Arrhenius analysis of measured rate constants confirms that they originate from a single activation energy.
ISSN:0031-9007
DOI:10.1103/PhysRevLett.96.055508