AFM Studies of Metal Deposition: Instantaneous Nucleation and the Growth of Cobalt Nanoparticles on Boron-Doped Diamond Electrodes

In situ atomic force microscopy (AFM) is used to study the growth of cobalt nuclei on a boron doped diamond electrode under potentiostatic control. The rate of growth of the nuclei at the electrode surface is monitored using AFM as a function of time at different deposition potentials. The nucleatio...

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Bibliographic Details
Published in:Chemphyschem 2006-03, Vol.7 (3), p.704-709
Main Authors: Simm, Andrew O., Ji, Xiaobo, Banks, Craig E., Hyde, Michael E., Compton, Richard G.
Format: Article
Language:English
Subjects:
Adsorption
atomic force microscopy
Chemistry
cobalt
Colloidal state and disperse state
cyclic voltammetry
Electrochemistry
Exact sciences and technology
General and physical chemistry
nanostructures
Physical and chemical studies. Granulometry. Electrokinetic phenomena
Study of interfaces
surface chemistry
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Summary:In situ atomic force microscopy (AFM) is used to study the growth of cobalt nuclei on a boron doped diamond electrode under potentiostatic control. The rate of growth of the nuclei at the electrode surface is monitored using AFM as a function of time at different deposition potentials. The nucleation of cobalt nuclei is found to be “instantaneous” and the growth of the nuclei is shown to be kinetically rather than diffusionally controlled over periods of tens and hundreds of seconds. At very short times (
ISSN:1439-4235
1439-7641
DOI:10.1002/cphc.200500557