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Nanoscale current modulations in Pr(0.7)Ca(0.3)MnO(3) thin films
Many theoretical and experimental efforts have been focused on the origin of the electric-pulse-induced resistance change effect. However, there are still various reports of the origin supporting either the bulk nature or the interface nature. To resolve the controversies, nanoscale electronic measu...
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| Published in: | The journal of physical chemistry. B 2006-12, Vol.110 (48), p.24277-24280 |
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| Main Authors: | , , , |
| Format: | Article |
| Language: | English |
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| container_end_page | 24280 |
| container_issue | 48 |
| container_start_page | 24277 |
| container_title | The journal of physical chemistry. B |
| container_volume | 110 |
| creator | Moon, Hak B Kim, Cheol H Ahn, Jai S Cho, Jin H |
| description | Many theoretical and experimental efforts have been focused on the origin of the electric-pulse-induced resistance change effect. However, there are still various reports of the origin supporting either the bulk nature or the interface nature. To resolve the controversies, nanoscale electronic measurements may provide essential clues. In this work, we report microscopic electrical properties of Pr(0.7)Ca(0.3)MnO(3) thin films. The resistance of a single-crystalline grain is not homogeneous in nanometer scale. We deduce that nanoscale inhomogeneity is related to the periodic relaxation of substrate-induced strain, which is caused by the lattice mismatch between the substrate and the thin film. |
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| ispartof | The journal of physical chemistry. B, 2006-12, Vol.110 (48), p.24277-24280 |
| issn | 1520-6106 |
| language | eng |
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| source | American Chemical Society:Jisc Collections:American Chemical Society Read & Publish Agreement 2022-2024 (Reading list) |
| title | Nanoscale current modulations in Pr(0.7)Ca(0.3)MnO(3) thin films |
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