The Peak Pairs algorithm for strain mapping from HRTEM images

Strain mapping is defined as a numerical image-processing technique that measures the local shifts of image details around a crystal defect with respect to the ideal, defect-free, positions in the bulk. Algorithms to map elastic strains from high-resolution transmission electron microscopy (HRTEM) i...

Full description

Saved in:
Bibliographic Details
Published in:Ultramicroscopy 2007-11, Vol.107 (12), p.1186-1193
Main Authors: Galindo, Pedro L., Kret, Sławomir, Sanchez, Ana M., Laval, Jean-Yves, Yáñez, Andrés, Pizarro, Joaquín, Guerrero, Elisa, Ben, Teresa, Molina, Sergio I.
Format: Article
Language:English
Subjects:
Data processing/image processing
High-resolution transmission electron microscopy (HRTEM)
Strain mapping
Citations: Items that this one cites
Items that cite this one
Online Access:Get full text
Tags: Add Tag
No Tags, Be the first to tag this record!
Description
Summary:Strain mapping is defined as a numerical image-processing technique that measures the local shifts of image details around a crystal defect with respect to the ideal, defect-free, positions in the bulk. Algorithms to map elastic strains from high-resolution transmission electron microscopy (HRTEM) images may be classified into two categories: those based on the detection of peaks of intensity in real space and the Geometric Phase approach, calculated in Fourier space. In this paper, we discuss both categories and propose an alternative real space algorithm ( Peak Pairs) based on the detection of pairs of intensity maxima in an affine transformed space dependent on the reference area. In spite of the fact that it is a real space approach, the Peak Pairs algorithm exhibits good behaviour at heavily distorted defect cores, e.g. interfaces and dislocations. Quantitative results are reported from experiments to determine local strain in different types of semiconductor heterostructures.
ISSN:0304-3991
1879-2723
DOI:10.1016/j.ultramic.2007.01.019