Dispersion properties of silicon nanophotonic waveguides investigated with Fourier optics

We experimentally investigate the dispersion relation of silicon-on-insulator waveguides in the 1.5 microm wavelength range by using a technique based on far-field Fourier-space imaging. The phase information of the propagating modes is transferred into the far field either by linear probe gratings...

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Bibliographic Details
Published in:Optics letters 2007-09, Vol.32 (18), p.2723-2725
Main Authors: JAGERSKA, J, LE THOMAS, N, HOUDRE, R, BOLTEN, J, MOORMANN, C, WAHLBRINK, T, CTYRAKY, J, WALDOW, M, FÖRST, M
Format: Article
Language:English
Subjects:
Applied sciences
Circuit properties
Electric, optical and optoelectronic circuits
Electronics
Exact sciences and technology
Fourier optics
Fundamental areas of phenomenology (including applications)
Imaging and optical processing
Integrated optics. Optical fibers and wave guides
Micro- and nanooptical devices
Optical and optoelectronic circuits
Optics
Physics
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Summary:We experimentally investigate the dispersion relation of silicon-on-insulator waveguides in the 1.5 microm wavelength range by using a technique based on far-field Fourier-space imaging. The phase information of the propagating modes is transferred into the far field either by linear probe gratings positioned 1 microm away from the waveguide core or by residual gratings located on the sidewalls of the waveguide. As a result, the dispersion curve of rectangular and slot waveguides as well as the group index dispersion are accurately determined.
ISSN:0146-9592
1539-4794
DOI:10.1364/OL.32.002723