Optical force field mapping in microdevices

We present a method for characterizing microscopic optical force fields. Two dimensional vector force maps are generated by measuring the optical force applied to a probe particle for a grid of particle positions. The method is used to map out the force field created by the beam from a lensed fiber...

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Bibliographic Details
Published in:Lab on a chip 2006-12, Vol.6 (12), p.1545-1547
Main Authors: Knöner, Gregor, Ratnapala, Adrian, Nieminen, Timo A, Vale, Chris J, Heckenberg, Norman R, Rubinsztein-Dunlop, Halina
Format: Article
Language:English
Subjects:
Lasers
Microscopy, Electron, Scanning - instrumentation
Microscopy, Electron, Scanning - methods
Optics and Photonics
Sensitivity and Specificity
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Summary:We present a method for characterizing microscopic optical force fields. Two dimensional vector force maps are generated by measuring the optical force applied to a probe particle for a grid of particle positions. The method is used to map out the force field created by the beam from a lensed fiber inside a liquid filled microdevice. We find transverse gradient forces and axial scattering forces on the order of 2 pN per 10 mW laser power which are constant over a considerable axial range (>35 microm). These findings suggest future useful applications of lensed fibers for particle guiding/sorting. The propulsion of a small particle at a constant velocity of 200 microm s(-1) is shown.
ISSN:1473-0197
1473-0189
DOI:10.1039/b608669a