Application of X-ray fluorescence for the analysis of some technological materials

Various X-ray fluorescence techniques have been developed for the determination of the composition of two- and three-component alloys. It has been found experimentally and confirmed theoretically that in some alloys, the composition can be determined without taking into account the absorption and se...

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Bibliographic Details
Published in:Applied radiation and isotopes 2005-11, Vol.63 (5), p.715-722
Main Authors: Mukhamedshina, N.M., Mirsagatova, A.A.
Format: Article
Language:English
Subjects:
Alloy waste
Si(Li) detector
Standardless fundamental parameter mode
X-ray fluorescence (XRF) technique
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Summary:Various X-ray fluorescence techniques have been developed for the determination of the composition of two- and three-component alloys. It has been found experimentally and confirmed theoretically that in some alloys, the composition can be determined without taking into account the absorption and secondary excitation of analytical characteristic lines, indicating that the contributions of these effects are opposite. X-ray techniques have also been applied to determine the composition of various kinds of technological waste. As a rule, waste contains many so-called “light” elements ( Z < 19 ) for which characteristic lines cannot be detected. In these cases, an independent measurement of the quantity of one of these elements is necessary to determine the quantities of the others. In most of the cases, instrumental neutron activation analysis is used for the independent measurement.
ISSN:0969-8043
1872-9800
DOI:10.1016/j.apradiso.2005.05.034