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Analysis of Organic Films and Interfacial Layers by Infrared Spectroscopic Ellipsometry

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Bibliographic Details
Published in:	Applied spectroscopy 2005-11, Vol.59 (11), p.272A-282A
Main Authors:	Hinrichs, K., Gensch, M., Esser, N.
Format:	Article
Language:	English
Subjects:	Algorithms Membranes, Artificial Organic Chemicals - analysis Organic Chemicals - chemistry Refractometry - methods Spectrophotometry, Infrared - methods
Citations:	Items that this one cites Items that cite this one
Online Access:	Get full text
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