Analysis of Organic Films and Interfacial Layers by Infrared Spectroscopic Ellipsometry

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Published in:Applied spectroscopy 2005-11, Vol.59 (11), p.272A-282A
Main Authors: Hinrichs, K., Gensch, M., Esser, N.
Format: Article
Language:English
Subjects:
Algorithms
Membranes, Artificial
Organic Chemicals - analysis
Organic Chemicals - chemistry
Refractometry - methods
Spectrophotometry, Infrared - methods
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cited_by cdi_FETCH-LOGICAL-c407t-43a7142f84341c72339c061eeedfd2099bc7309a70d39454fcc8422b4d61bd703
cites cdi_FETCH-LOGICAL-c407t-43a7142f84341c72339c061eeedfd2099bc7309a70d39454fcc8422b4d61bd703
container_end_page 282A
container_issue 11
container_start_page 272A
container_title Applied spectroscopy
container_volume 59
creator Hinrichs, K.
Gensch, M.
Esser, N.
description
doi_str_mv 10.1366/000370205774783106
format article
fullrecord <record><control><sourceid>proquest_cross</sourceid><recordid>TN_cdi_proquest_miscellaneous_68844762</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sage_id>10.1366_000370205774783106</sage_id><sourcerecordid>68844762</sourcerecordid><originalsourceid>FETCH-LOGICAL-c407t-43a7142f84341c72339c061eeedfd2099bc7309a70d39454fcc8422b4d61bd703</originalsourceid><addsrcrecordid>eNp9kMtKAzEUhoMotlZfwIVk5W7syWWSmWUprRYKXai4HDK5lClzM5ku5u1NacGF4OpwDt__c_gQeiTwQpgQcwBgEiikUnKZMQLiCk1JzlnCUgbXaHoCkkhkE3QXwiGuac7SWzQhghGRQjpFX4tW1WOoAu4c3vm9aiuN11XdBKxagzftYL1TulI13qrR-oDLMV6dV94a_N5bPfgu6K6PsVVdV33oGjv48R7dOFUH-3CZM_S5Xn0s35Lt7nWzXGwTzUEOCWdKEk5dxhknWlLGcg2CWGuNMxTyvNSSQa4kGJbzlDutM05pyY0gpZHAZuj53Nv77vtow1A0VdC2rlVru2MoRJZxLgWNID2DOv4bvHVF76tG-bEgUJx0Fn91xtDTpf1YNtb8Ri7-IjA_A0HtbXHojj7qDP9V_gDjfnyc</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>68844762</pqid></control><display><type>article</type><title>Analysis of Organic Films and Interfacial Layers by Infrared Spectroscopic Ellipsometry</title><source>SAGE</source><creator>Hinrichs, K. ; Gensch, M. ; Esser, N.</creator><creatorcontrib>Hinrichs, K. ; Gensch, M. ; Esser, N.</creatorcontrib><identifier>ISSN: 0003-7028</identifier><identifier>EISSN: 1943-3530</identifier><identifier>DOI: 10.1366/000370205774783106</identifier><identifier>PMID: 16316505</identifier><language>eng</language><publisher>London, England: SAGE Publications</publisher><subject>Algorithms ; Membranes, Artificial ; Organic Chemicals - analysis ; Organic Chemicals - chemistry ; Refractometry - methods ; Spectrophotometry, Infrared - methods</subject><ispartof>Applied spectroscopy, 2005-11, Vol.59 (11), p.272A-282A</ispartof><rights>2005 Society for Applied Spectroscopy</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c407t-43a7142f84341c72339c061eeedfd2099bc7309a70d39454fcc8422b4d61bd703</citedby><cites>FETCH-LOGICAL-c407t-43a7142f84341c72339c061eeedfd2099bc7309a70d39454fcc8422b4d61bd703</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>314,780,784,27924,27925,79364</link.rule.ids><backlink>$$Uhttps://www.ncbi.nlm.nih.gov/pubmed/16316505$$D View this record in MEDLINE/PubMed$$Hfree_for_read</backlink></links><search><creatorcontrib>Hinrichs, K.</creatorcontrib><creatorcontrib>Gensch, M.</creatorcontrib><creatorcontrib>Esser, N.</creatorcontrib><title>Analysis of Organic Films and Interfacial Layers by Infrared Spectroscopic Ellipsometry</title><title>Applied spectroscopy</title><addtitle>Appl Spectrosc</addtitle><subject>Algorithms</subject><subject>Membranes, Artificial</subject><subject>Organic Chemicals - analysis</subject><subject>Organic Chemicals - chemistry</subject><subject>Refractometry - methods</subject><subject>Spectrophotometry, Infrared - methods</subject><issn>0003-7028</issn><issn>1943-3530</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2005</creationdate><recordtype>article</recordtype><recordid>eNp9kMtKAzEUhoMotlZfwIVk5W7syWWSmWUprRYKXai4HDK5lClzM5ku5u1NacGF4OpwDt__c_gQeiTwQpgQcwBgEiikUnKZMQLiCk1JzlnCUgbXaHoCkkhkE3QXwiGuac7SWzQhghGRQjpFX4tW1WOoAu4c3vm9aiuN11XdBKxagzftYL1TulI13qrR-oDLMV6dV94a_N5bPfgu6K6PsVVdV33oGjv48R7dOFUH-3CZM_S5Xn0s35Lt7nWzXGwTzUEOCWdKEk5dxhknWlLGcg2CWGuNMxTyvNSSQa4kGJbzlDutM05pyY0gpZHAZuj53Nv77vtow1A0VdC2rlVru2MoRJZxLgWNID2DOv4bvHVF76tG-bEgUJx0Fn91xtDTpf1YNtb8Ri7-IjA_A0HtbXHojj7qDP9V_gDjfnyc</recordid><startdate>20051101</startdate><enddate>20051101</enddate><creator>Hinrichs, K.</creator><creator>Gensch, M.</creator><creator>Esser, N.</creator><general>SAGE Publications</general><scope>CGR</scope><scope>CUY</scope><scope>CVF</scope><scope>ECM</scope><scope>EIF</scope><scope>NPM</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7X8</scope></search><sort><creationdate>20051101</creationdate><title>Analysis of Organic Films and Interfacial Layers by Infrared Spectroscopic Ellipsometry</title><author>Hinrichs, K. ; Gensch, M. ; Esser, N.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c407t-43a7142f84341c72339c061eeedfd2099bc7309a70d39454fcc8422b4d61bd703</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2005</creationdate><topic>Algorithms</topic><topic>Membranes, Artificial</topic><topic>Organic Chemicals - analysis</topic><topic>Organic Chemicals - chemistry</topic><topic>Refractometry - methods</topic><topic>Spectrophotometry, Infrared - methods</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Hinrichs, K.</creatorcontrib><creatorcontrib>Gensch, M.</creatorcontrib><creatorcontrib>Esser, N.</creatorcontrib><collection>Medline</collection><collection>MEDLINE</collection><collection>MEDLINE (Ovid)</collection><collection>MEDLINE</collection><collection>MEDLINE</collection><collection>PubMed</collection><collection>CrossRef</collection><collection>MEDLINE - Academic</collection><jtitle>Applied spectroscopy</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Hinrichs, K.</au><au>Gensch, M.</au><au>Esser, N.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Analysis of Organic Films and Interfacial Layers by Infrared Spectroscopic Ellipsometry</atitle><jtitle>Applied spectroscopy</jtitle><addtitle>Appl Spectrosc</addtitle><date>2005-11-01</date><risdate>2005</risdate><volume>59</volume><issue>11</issue><spage>272A</spage><epage>282A</epage><pages>272A-282A</pages><issn>0003-7028</issn><eissn>1943-3530</eissn><cop>London, England</cop><pub>SAGE Publications</pub><pmid>16316505</pmid><doi>10.1366/000370205774783106</doi><tpages>11</tpages></addata></record>
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1943-3530
language eng
recordid cdi_proquest_miscellaneous_68844762
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subjects Algorithms
Membranes, Artificial
Organic Chemicals - analysis
Organic Chemicals - chemistry
Refractometry - methods
Spectrophotometry, Infrared - methods
title Analysis of Organic Films and Interfacial Layers by Infrared Spectroscopic Ellipsometry
url http://sfxeu10.hosted.exlibrisgroup.com/loughborough?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2024-12-21T08%3A26%3A30IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_cross&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Analysis%20of%20Organic%20Films%20and%20Interfacial%20Layers%20by%20Infrared%20Spectroscopic%20Ellipsometry&rft.jtitle=Applied%20spectroscopy&rft.au=Hinrichs,%20K.&rft.date=2005-11-01&rft.volume=59&rft.issue=11&rft.spage=272A&rft.epage=282A&rft.pages=272A-282A&rft.issn=0003-7028&rft.eissn=1943-3530&rft_id=info:doi/10.1366/000370205774783106&rft_dat=%3Cproquest_cross%3E68844762%3C/proquest_cross%3E%3Cgrp_id%3Ecdi_FETCH-LOGICAL-c407t-43a7142f84341c72339c061eeedfd2099bc7309a70d39454fcc8422b4d61bd703%3C/grp_id%3E%3Coa%3E%3C/oa%3E%3Curl%3E%3C/url%3E&rft_id=info:oai/&rft_pqid=68844762&rft_id=info:pmid/16316505&rft_sage_id=10.1366_000370205774783106&rfr_iscdi=true