Three-dimensional particle imaging by defocusing method with an annular aperture

We propose an annular-aperture-based defocusing technique for three-dimensional (3D) particle metrology from a single camera view. This simple configuration has high optical efficiency and the ability to deal with overlapped defocused images. Initial results show that an uncertainty in depth of 23 m...

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Bibliographic Details
Published in:Optics letters 2008-05, Vol.33 (9), p.905-907
Main Authors: DEJIAO LIN, ANGARITA-JAIMES, Natalia C, SIYU CHEN, GREENAWAY, Alan H, TOWERS, Catherine E, TOWERS, David P
Format: Article
Language:English
Subjects:
Exact sciences and technology
Fundamental areas of phenomenology (including applications)
Imaging and optical processing
Measurements common to several branches of physics and astronomy
Metrology, measurements and laboratory procedures
Optics
Physics
Velocity, acceleration and rotation
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Summary:We propose an annular-aperture-based defocusing technique for three-dimensional (3D) particle metrology from a single camera view. This simple configuration has high optical efficiency and the ability to deal with overlapped defocused images. Initial results show that an uncertainty in depth of 23 microm can be achieved over a range of 10 mm for macroscopic systems. This method can also be applied in microscopy for the measurement of fluorescently doped microparticles, thus providing a promising solution for 3D flow metrology at both macroscales and microscales.
ISSN:0146-9592
1539-4794
DOI:10.1364/OL.33.000905