Atomic scale Kelvin probe force microscopy studies of the surface potential variations on the TiO2(110) surface

From an interplay of simultaneous Kelvin probe force microscopy and noncontact atomic force microscopy we study atomic-scale variations in the electronic surface potential on TiO(2)(110). Both imaging channels reveal an atomic contrast reflected by the geometry and charged state of the alternating r...

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Bibliographic Details
Published in:Physical review letters 2008-06, Vol.100 (23), p.236104-236104
Main Authors: Enevoldsen, G H, Glatzel, T, Christensen, M C, Lauritsen, J V, Besenbacher, F
Format: Article
Language:English
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Summary:From an interplay of simultaneous Kelvin probe force microscopy and noncontact atomic force microscopy we study atomic-scale variations in the electronic surface potential on TiO(2)(110). Both imaging channels reveal an atomic contrast reflected by the geometry and charged state of the alternating rows of Ti and O surface atoms. From a thorough cross-section analysis we add significant trust to the concept of a local contact potential difference, and determine from this the chemical identity of individual surface species and their role in setting up the local surface potential.
ISSN:0031-9007
DOI:10.1103/PhysRevLett.100.236104