Prediction of Sublayer Depth in Turbid Media Using Spatially Offset Raman Spectroscopy

We demonstrate experimentally the feasibility of monitoring the depth of optically thick layers within turbid media using spatially offset Raman spectroscopy (SORS) in combination with multivariate analysis. The method uses the deep penetration capability of SORS to characterize significantly thicke...

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Bibliographic Details
Published in:Analytical chemistry (Washington) 2008-11, Vol.80 (21), p.8146-8152
Main Authors: Macleod, N. A, Goodship, A, Parker, A. W, Matousek, P
Format: Article
Language:English
Subjects:
Analytical chemistry
Chemistry
Exact sciences and technology
Feasibility
Multivariate analysis
Nephelometry and Turbidimetry - instrumentation
Nephelometry and Turbidimetry - methods
Spectrometric and optical methods
Spectrum analysis
Spectrum Analysis, Raman - instrumentation
Spectrum Analysis, Raman - methods
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Summary:We demonstrate experimentally the feasibility of monitoring the depth of optically thick layers within turbid media using spatially offset Raman spectroscopy (SORS) in combination with multivariate analysis. The method uses the deep penetration capability of SORS to characterize significantly thicker (by at least a factor of 2) layers than possible with conventional Raman spectroscopy. Typical relative accuracies were between 5 and 10%. The incorporation of depth information into a SORS experiment as an additional dimension allows pure spectra of each individual layer to be resolved using three-dimensional multivariate techniques (parallel factor analysis, PARAFAC) to accuracies comparable with the results of a two-dimensional analysis.
ISSN:0003-2700
1520-6882
DOI:10.1021/ac801219a