Scattering of the fundamental shear horizontal guided wave by a part-thickness crack in an isotropic plate

• Published in: The Journal of the Acoustical Society of America 2008-11, Vol.124 (5), p.2895-2904
• Main Authors: Rajagopal, P., Lowe, M. J. S.
• Format: Article
• Language: English
• Subjects: Acoustics; Computer Simulation; Elasticity; Exact sciences and technology; Fundamental areas of phenomenology (including applications); Materials Testing - methods; Models, Theoretical; Physics; Scattering, Radiation; Sound; Structural acoustics and vibration; Ultrasonics
• ISSN: 0001-4966; 1520-8524
• DOI: 10.1121/1.2982410

The interaction of the fundamental shear horizontal (SH0) guided mode with part-thickness cracks in an isotropic plate is studied as an extension within the context and general framework of previous work [ " Short range scattering of the fundamental shear horizontal guided wave mode normally incident at a through thickness crack in an isotropic plate ," J. Acoust Soc. Am. 122 , 1527-1538 ( 2007 ) ; " Angular influence on scattering when the fundamental shear horizontal guided wave mode is incident at a through-thickness crack in an isotropic plate ," J. Acoust. Soc. Am. 124 , 2021-2030 ( 2008 ) ] by the authors with through-cracks. The symmetric incidence case where the principal direction of the incident beam bisects the crack face at 90° is studied using finite element simulations validated by experiments and analysis, and conclusions are inferred for general incidence angles using insights obtained with the through-thickness studies. The influence of the crack length and the monitoring distance on the specular reflection is first examined, followed by a study of the angular profile of the reflected field. With each crack length considered, the crack depth and operating frequencies are varied. For all crack depths studied, the trend of the results is identical to that for the corresponding through-thickness case and the values differ only by a frequency dependent scale factor. Theoretical analysis is used to understand the physical basis for such behavior and estimates are suggested for the scale factor-exact for the high-frequency scattering regime and empirical for the medium- and low-frequency regimes.