A simple method for producing flattened atomic force microscopy tips

We describe a simple and reliable procedure for obtaining a flat plateau on top of standard silicon nitride atomic force microscopy tips by scanning them over the focus of a high-numerical-aperture objective illuminated by near-infrared ultrashort laser pulses. Flattened tips produced this way exhib...

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Bibliographic Details
Published in:Review of scientific instruments 2008-01, Vol.79 (1), p.016103-016103-2
Main Authors: Biagioni, P., Farahani, J. N., Mühlschlegel, P., Eisler, H.-J., Pohl, D. W., Hecht, B.
Format: Article
Language:English
Subjects:
Equipment Design - instrumentation
Equipment Design - methods
Equipment Failure Analysis
Microscopy, Atomic Force - instrumentation
Microscopy, Atomic Force - methods
Nanotechnology - instrumentation
Nanotechnology - methods
Reproducibility of Results
Sensitivity and Specificity
Transducers
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Summary:We describe a simple and reliable procedure for obtaining a flat plateau on top of standard silicon nitride atomic force microscopy tips by scanning them over the focus of a high-numerical-aperture objective illuminated by near-infrared ultrashort laser pulses. Flattened tips produced this way exhibit a plateau that is parallel to the substrate when the cantilever is mounted. They represent a valid and cost-effective alternative to commercially available plateau tips.
ISSN:0034-6748
1089-7623
DOI:10.1063/1.2834875