Atomically resolved imaging by low-temperature frequency-modulation atomic force microscopy using a quartz length-extension resonator

Low-temperature ultrahigh vacuum frequency-modulation atomic force microscopy (AFM) was performed using a 1 MHz length-extension type of quartz resonator as a force sensor. Taking advantage of the high stiffness of the resonator, the AFM was operated with an oscillation amplitude smaller than 100 pm...

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Bibliographic Details
Published in:Review of scientific instruments 2008-03, Vol.79 (3), p.033703-033703-6
Main Authors: An, Toshu, Nishio, Takahiro, Eguchi, Toyoaki, Ono, Masanori, Nomura, Atsushi, Akiyama, Kotone, Hasegawa, Yukio
Format: Article
Language:English
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Summary:Low-temperature ultrahigh vacuum frequency-modulation atomic force microscopy (AFM) was performed using a 1 MHz length-extension type of quartz resonator as a force sensor. Taking advantage of the high stiffness of the resonator, the AFM was operated with an oscillation amplitude smaller than 100 pm , which is favorable for high spatial resolution, without snapping an AFM tip onto a sample surface. Atomically resolved imaging of the adatom structure on the Si ( 111 ) - ( 7 × 7 ) surface was successfully obtained.
ISSN:0034-6748
1089-7623
DOI:10.1063/1.2830937