technique for improved focused ion beam milling of cryo-prepared life science specimens

The combination of focused ion beam and scanning electron microscopy with a cryo-preparation/transfer system allows specimens to be milled at low temperatures. However, for biological specimens in particular, the quality of results is strongly dependent on correct preparation of the specimen surface...

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Published in:Journal of microscopy (Oxford) 2007-06, Vol.226 (3), p.263-269
Main Authors: HAYLES, M.F, STOKES, D.J, PHIFER, D, FINDLAY, K.C
Format: Article
Language:English
Subjects:
Cryo
FIB
gas injector system (GIS)
life sciences
SEM
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cited_by cdi_FETCH-LOGICAL-c3915-3cc4b76de1237df1b88e85fbcab2a17c64f5f1aa7742f4ec6863914eff7cf1c93
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description The combination of focused ion beam and scanning electron microscopy with a cryo-preparation/transfer system allows specimens to be milled at low temperatures. However, for biological specimens in particular, the quality of results is strongly dependent on correct preparation of the specimen surface. We demonstrate a method for deposition of a protective, planarizing surface layer onto a cryo-sample, enabling high-quality cross-sectioning using the ion beam and investigation of structures at the nanoscale.
doi_str_mv 10.1111/j.1365-2818.2007.01775.x
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ispartof Journal of microscopy (Oxford), 2007-06, Vol.226 (3), p.263-269
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source Wiley-Blackwell Read & Publish Collection
subjects Cryo
FIB
gas injector system (GIS)
life sciences
SEM
title technique for improved focused ion beam milling of cryo-prepared life science specimens
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