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Scanning Probe Microscopy

Scanning probe microscopy (SPM) encompasses a family of techniques that measures surface topography and surface properties on the atomic scale. The number of papers devoted to technical advances and applications of SPM continues to rise.

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Bibliographic Details
Published in:Analytical chemistry (Washington) 2000-06, Vol.72 (12), p.189-196
Main Authors: Lillehei, Peter T, Bottomley, Lawrence A
Format: Article
Language:English
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Description
Summary:Scanning probe microscopy (SPM) encompasses a family of techniques that measures surface topography and surface properties on the atomic scale. The number of papers devoted to technical advances and applications of SPM continues to rise.
ISSN:0003-2700
1520-6882
DOI:10.1021/a10000108