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Scanning Probe Microscopy
Scanning probe microscopy (SPM) encompasses a family of techniques that measures surface topography and surface properties on the atomic scale. The number of papers devoted to technical advances and applications of SPM continues to rise.
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Published in: | Analytical chemistry (Washington) 2000-06, Vol.72 (12), p.189-196 |
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Main Authors: | , |
Format: | Article |
Language: | English |
Subjects: | |
Citations: | Items that this one cites Items that cite this one |
Online Access: | Get full text |
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Summary: | Scanning probe microscopy (SPM) encompasses a family of techniques that measures surface topography and surface properties on the atomic scale. The number of papers devoted to technical advances and applications of SPM continues to rise. |
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ISSN: | 0003-2700 1520-6882 |
DOI: | 10.1021/a10000108 |