Ultra stable tuning fork sensor for low-temperature near-field spectroscopy

We report on a distance control system for low-temperature scanning near-field optical microscopy, based on quartz tuning fork as shear force sensor. By means of a particular tuning fork-optical fiber configuration, the sensor is electrically dithered by an applied alternate voltage, without any sup...

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Bibliographic Details
Published in:Ultramicroscopy 2002-02, Vol.90 (2), p.97-101
Main Authors: Crottini, A., Staehli, J.L., Deveaud, B., Wang, X.L., Ogura, M.
Format: Article
Language:English
Subjects:
Exact sciences and technology
Instruments, apparatus, components and techniques common to several branches of physics and astronomy
Near-field scanning optical microscopes
Physics
Scanning probe microscopes, components and techniques
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Summary:We report on a distance control system for low-temperature scanning near-field optical microscopy, based on quartz tuning fork as shear force sensor. By means of a particular tuning fork-optical fiber configuration, the sensor is electrically dithered by an applied alternate voltage, without any supplementary driving piezo, as done so far. The sensitivity in the approach direction is 0.2 nm, and quality factors up to 2850 have been reached. No electronic components are needed close to the sensor, allowing to employ it in a liquid He environment. The system is extremely compact and allows for several hours of stability at 5 K.
ISSN:0304-3991
1879-2723
DOI:10.1016/S0304-3991(01)00144-9