Particle transport in asymmetric scanning-line optical tweezers

We describe a scanning-line optical tweezing technique with an asymmetric beam profile in the back focal plane of the microscope objective. The motion of a trapped particle along the scan line is studied as a function of beam asymmetry, and it is shown that this technique can be used to exert a cons...

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Bibliographic Details
Published in:Physical review. E, Statistical, nonlinear, and soft matter physics Statistical, nonlinear, and soft matter physics, 2003-11, Vol.68 (5 Pt 1), p.051907-051907
Main Authors: Liesfeld, B, Nambiar, R, Meiners, J C
Format: Article
Language:English
Subjects:
Biophysical Phenomena
Biophysics
Lasers
Micromanipulation - methods
Microscopy - methods
Optics and Photonics
Scattering, Radiation
Surgical Instruments
Time Factors
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Summary:We describe a scanning-line optical tweezing technique with an asymmetric beam profile in the back focal plane of the microscope objective. The motion of a trapped particle along the scan line is studied as a function of beam asymmetry, and it is shown that this technique can be used to exert a constant lateral force on the particle, realizing purely optical constant-force tweezing. The observed effect is attributed in a geometric optics model to a non-zero lateral component of the scattering force.
ISSN:1539-3755
DOI:10.1103/PhysRevE.68.051907