Quantitative atomic resolution scanning transmission electron microscopy

Complete understanding of atomic resolution high-angle annular dark-field (Z-contrast) images requires quantitative agreement between simulations and experiments. We show that intensity variations can be placed on an absolute scale by normalizing the measured image intensities to the incident beam....

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Bibliographic Details
Published in:Physical review letters 2008-05, Vol.100 (20), p.206101-206101, Article 206101
Main Authors: LeBeau, James M, Findlay, Scott D, Allen, Leslie J, Stemmer, Susanne
Format: Article
Language:English
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Summary:Complete understanding of atomic resolution high-angle annular dark-field (Z-contrast) images requires quantitative agreement between simulations and experiments. We show that intensity variations can be placed on an absolute scale by normalizing the measured image intensities to the incident beam. We construct fractional intensity images of a SrTiO3 single crystal for regions of different thickness up to 120 nm. Experimental images are compared directly with image simulations. Provided that spatial incoherence is taken into account in the simulations, almost perfect agreement is found between simulation and experiment.
ISSN:0031-9007
1079-7114
DOI:10.1103/physrevlett.100.206101