Model for striped growth

We introduce a model for describing the defected growth of striped patterns. This model, while roughly related to the Swift-Hohenberg model, generates a quite different mixture of defects during phase ordering. We find two characteristic lengths in the system: the scaling length L(t), and the averag...

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Bibliographic Details
Published in:Physical review. E, Statistical, nonlinear, and soft matter physics Statistical, nonlinear, and soft matter physics, 2004-01, Vol.69 (1 Pt 1), p.011104-011104, Article 011104
Main Authors: Qian, Hai, Mazenko, Gene F
Format: Article
Language:English
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Summary:We introduce a model for describing the defected growth of striped patterns. This model, while roughly related to the Swift-Hohenberg model, generates a quite different mixture of defects during phase ordering. We find two characteristic lengths in the system: the scaling length L(t), and the average width of the domain walls. The growth law exponent is larger than the value of 1/2 found in typical point defect systems.
ISSN:1539-3755
1550-2376
DOI:10.1103/PhysRevE.69.011104