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Magnetic characterization of microscopic particles by MO‐SNOM
Summary This paper reports on the development of a magneto‐optical scanning near‐field optical microscope and the experimental near‐field study of the domain structure for a model magnetic particle of 16 × 16 µm2 of a Co70.4Fe4.6Si15B10 amorphous thin film, deposited on a silicon substrate. We prese...
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Published in: | Journal of microscopy (Oxford) 2004-04, Vol.214 (1), p.22-26 |
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container_title | Journal of microscopy (Oxford) |
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creator | Schoenmaker, J. Lancarotte, M. S. Seabra, A. C. Souche, Y. Santos, A. D. |
description | Summary
This paper reports on the development of a magneto‐optical scanning near‐field optical microscope and the experimental near‐field study of the domain structure for a model magnetic particle of 16 × 16 µm2 of a Co70.4Fe4.6Si15B10 amorphous thin film, deposited on a silicon substrate. We present the topographic, optical and magneto‐optical differential susceptibility (MODS) images of the particle. Imaging by using the local MODS reveals the domain structure. These images are also used for positioning the tip in order to acquire local hysteresis loops, with submicrometre spatial resolution. |
doi_str_mv | 10.1111/j.0022-2720.2004.01303.x |
format | article |
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This paper reports on the development of a magneto‐optical scanning near‐field optical microscope and the experimental near‐field study of the domain structure for a model magnetic particle of 16 × 16 µm2 of a Co70.4Fe4.6Si15B10 amorphous thin film, deposited on a silicon substrate. We present the topographic, optical and magneto‐optical differential susceptibility (MODS) images of the particle. Imaging by using the local MODS reveals the domain structure. These images are also used for positioning the tip in order to acquire local hysteresis loops, with submicrometre spatial resolution.</description><identifier>ISSN: 0022-2720</identifier><identifier>EISSN: 1365-2818</identifier><identifier>DOI: 10.1111/j.0022-2720.2004.01303.x</identifier><identifier>PMID: 15049864</identifier><language>eng</language><publisher>Oxford, UK: Blackwell Science Ltd</publisher><subject>Amorphous alloys ; Boron - chemistry ; Cobalt - chemistry ; e‐beam lithography ; Image Processing, Computer-Assisted - methods ; Iron - chemistry ; Magnetics ; magnetism ; magneto‐optics ; Microscopy, Electron, Scanning - instrumentation ; Microscopy, Electron, Scanning - methods ; Optics and Photonics - instrumentation ; scanning near‐field optics ; Silicon - chemistry</subject><ispartof>Journal of microscopy (Oxford), 2004-04, Vol.214 (1), p.22-26</ispartof><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c4313-c9b3d122d198dd9ca63616f60cf7edf73a398538cf6d7773a53d4331fad4853</citedby><cites>FETCH-LOGICAL-c4313-c9b3d122d198dd9ca63616f60cf7edf73a398538cf6d7773a53d4331fad4853</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>314,780,784,27924,27925</link.rule.ids><backlink>$$Uhttps://www.ncbi.nlm.nih.gov/pubmed/15049864$$D View this record in MEDLINE/PubMed$$Hfree_for_read</backlink></links><search><creatorcontrib>Schoenmaker, J.</creatorcontrib><creatorcontrib>Lancarotte, M. S.</creatorcontrib><creatorcontrib>Seabra, A. C.</creatorcontrib><creatorcontrib>Souche, Y.</creatorcontrib><creatorcontrib>Santos, A. D.</creatorcontrib><title>Magnetic characterization of microscopic particles by MO‐SNOM</title><title>Journal of microscopy (Oxford)</title><addtitle>J Microsc</addtitle><description>Summary
This paper reports on the development of a magneto‐optical scanning near‐field optical microscope and the experimental near‐field study of the domain structure for a model magnetic particle of 16 × 16 µm2 of a Co70.4Fe4.6Si15B10 amorphous thin film, deposited on a silicon substrate. We present the topographic, optical and magneto‐optical differential susceptibility (MODS) images of the particle. Imaging by using the local MODS reveals the domain structure. These images are also used for positioning the tip in order to acquire local hysteresis loops, with submicrometre spatial resolution.</description><subject>Amorphous alloys</subject><subject>Boron - chemistry</subject><subject>Cobalt - chemistry</subject><subject>e‐beam lithography</subject><subject>Image Processing, Computer-Assisted - methods</subject><subject>Iron - chemistry</subject><subject>Magnetics</subject><subject>magnetism</subject><subject>magneto‐optics</subject><subject>Microscopy, Electron, Scanning - instrumentation</subject><subject>Microscopy, Electron, Scanning - methods</subject><subject>Optics and Photonics - instrumentation</subject><subject>scanning near‐field optics</subject><subject>Silicon - chemistry</subject><issn>0022-2720</issn><issn>1365-2818</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2004</creationdate><recordtype>article</recordtype><recordid>eNqNkEtOwzAQQC0EoqVwBZQVuwT_EjsLhBDiU9TQRdlbrj-QKmmCnYqWFUfgjJwEh1awZTYzHr8ZWw-ACMEEhThfJBBiHGOGYYIhpAlEBJJkvQeGiGRpjDni-2D4Cw3AkfcLCCFPOTwEA5RCmvOMDsFlIZ-XpitVpF6kk6ozrnyXXdkso8ZGdalc41XThvtWuoBVxkfzTVRMvz4-Z4_T4hgcWFl5c7LLIzC7vXm6vo8n07vx9dUkVpQgEqt8TjTCWKOca50rmZEMZTaDyjKjLSOS5DwlXNlMMxaOKdGUEGSlpqE_Amfbra1rXlfGd6IuvTJVJZemWXnBEOMpZTSAfAv2__bOWNG6spZuIxAUvTqxEL0V0VsRvTrxo06sw-jp7o3VvDb6b3DnKgAXW-CtrMzm34vFQzHuK_IN5p98uA</recordid><startdate>200404</startdate><enddate>200404</enddate><creator>Schoenmaker, J.</creator><creator>Lancarotte, M. S.</creator><creator>Seabra, A. C.</creator><creator>Souche, Y.</creator><creator>Santos, A. D.</creator><general>Blackwell Science Ltd</general><scope>CGR</scope><scope>CUY</scope><scope>CVF</scope><scope>ECM</scope><scope>EIF</scope><scope>NPM</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7X8</scope></search><sort><creationdate>200404</creationdate><title>Magnetic characterization of microscopic particles by MO‐SNOM</title><author>Schoenmaker, J. ; Lancarotte, M. S. ; Seabra, A. C. ; Souche, Y. ; Santos, A. D.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c4313-c9b3d122d198dd9ca63616f60cf7edf73a398538cf6d7773a53d4331fad4853</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2004</creationdate><topic>Amorphous alloys</topic><topic>Boron - chemistry</topic><topic>Cobalt - chemistry</topic><topic>e‐beam lithography</topic><topic>Image Processing, Computer-Assisted - methods</topic><topic>Iron - chemistry</topic><topic>Magnetics</topic><topic>magnetism</topic><topic>magneto‐optics</topic><topic>Microscopy, Electron, Scanning - instrumentation</topic><topic>Microscopy, Electron, Scanning - methods</topic><topic>Optics and Photonics - instrumentation</topic><topic>scanning near‐field optics</topic><topic>Silicon - chemistry</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Schoenmaker, J.</creatorcontrib><creatorcontrib>Lancarotte, M. S.</creatorcontrib><creatorcontrib>Seabra, A. C.</creatorcontrib><creatorcontrib>Souche, Y.</creatorcontrib><creatorcontrib>Santos, A. D.</creatorcontrib><collection>Medline</collection><collection>MEDLINE</collection><collection>MEDLINE (Ovid)</collection><collection>MEDLINE</collection><collection>MEDLINE</collection><collection>PubMed</collection><collection>CrossRef</collection><collection>MEDLINE - Academic</collection><jtitle>Journal of microscopy (Oxford)</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Schoenmaker, J.</au><au>Lancarotte, M. S.</au><au>Seabra, A. C.</au><au>Souche, Y.</au><au>Santos, A. D.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Magnetic characterization of microscopic particles by MO‐SNOM</atitle><jtitle>Journal of microscopy (Oxford)</jtitle><addtitle>J Microsc</addtitle><date>2004-04</date><risdate>2004</risdate><volume>214</volume><issue>1</issue><spage>22</spage><epage>26</epage><pages>22-26</pages><issn>0022-2720</issn><eissn>1365-2818</eissn><abstract>Summary
This paper reports on the development of a magneto‐optical scanning near‐field optical microscope and the experimental near‐field study of the domain structure for a model magnetic particle of 16 × 16 µm2 of a Co70.4Fe4.6Si15B10 amorphous thin film, deposited on a silicon substrate. We present the topographic, optical and magneto‐optical differential susceptibility (MODS) images of the particle. Imaging by using the local MODS reveals the domain structure. These images are also used for positioning the tip in order to acquire local hysteresis loops, with submicrometre spatial resolution.</abstract><cop>Oxford, UK</cop><pub>Blackwell Science Ltd</pub><pmid>15049864</pmid><doi>10.1111/j.0022-2720.2004.01303.x</doi><tpages>5</tpages></addata></record> |
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subjects | Amorphous alloys Boron - chemistry Cobalt - chemistry e‐beam lithography Image Processing, Computer-Assisted - methods Iron - chemistry Magnetics magnetism magneto‐optics Microscopy, Electron, Scanning - instrumentation Microscopy, Electron, Scanning - methods Optics and Photonics - instrumentation scanning near‐field optics Silicon - chemistry |
title | Magnetic characterization of microscopic particles by MO‐SNOM |
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