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Study of the field around magnetic force microscopy probes using electron holography
We have used electron holography to perform quantitative investigations of the leakage flux of thin film tips used as probes in magnetic force microscopy. A method to deduce an arrangement of magnetic domains in a thin magnetic whisker from the knowledge of the stray flux is also described. A simple...
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Published in: | Ultramicroscopy 2004-05, Vol.99 (2), p.95-102 |
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Main Authors: | , , |
Format: | Article |
Language: | English |
Subjects: | |
Citations: | Items that this one cites Items that cite this one |
Online Access: | Get full text |
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Summary: | We have used electron holography to perform quantitative investigations of the leakage flux of thin film tips used as probes in magnetic force microscopy. A method to deduce an arrangement of magnetic domains in a thin magnetic whisker from the knowledge of the stray flux is also described. A simple analytical model of the magnetic properties of the probes allows the extraction of computer images, which simulate the experimental results satisfactory. The reliability of the recorded experimental maps of the magnetic flux arising from these kinds of sensors allows an evaluation of the total flux affecting the sample and the calculation of the magnetic field profile along the tip axis. |
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ISSN: | 0304-3991 1879-2723 |
DOI: | 10.1016/j.ultramic.2003.06.001 |