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SCID-PANSS: Two-tier diagnostic system for psychotic disorders

The SCID-PANSS was developed as a two-tier diagnostic system for psychotic disorders to supplement categorical diagnosis with functional-dimensional assessment. The procedure combines the DSM-III-R Structured Clinical Interview and Rating Criteria (SCID) with those from the Positive and Negative Syn...

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Bibliographic Details
Published in:Comprehensive psychiatry 1991-07, Vol.32 (4), p.355-361
Main Authors: Kay, Stanley R., Opler, Lewis A., Spitzer, Robert L., Williams, Janet B.W., Fiszbein, Abraham, Gorelick, Amy
Format: Article
Language:English
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Summary:The SCID-PANSS was developed as a two-tier diagnostic system for psychotic disorders to supplement categorical diagnosis with functional-dimensional assessment. The procedure combines the DSM-III-R Structured Clinical Interview and Rating Criteria (SCID) with those from the Positive and Negative Syndrome Scale (PANSS). The comprehensive 50- to 60-minute interview yields diagnostic classification, plus a profile of 30 symptoms and 10 dimensional scales, including positive and negative syndromes, depression, thought disturbance, and severity of illness. A study of 34 psychotic inpatients assessed by five psychiatrists showed strong interrater correlations (0.85 to 0.97 for summary scales, P < .0001), supporting the reliability of the SCID-PANSS for clinical and research applications.
ISSN:0010-440X
1532-8384
DOI:10.1016/0010-440X(91)90085-Q