Mapping the mesoscale interface structure in polycrystalline materials

• Published in: Ultramicroscopy 2002-11, Vol.93 (2), p.99-109
• Main Authors: Wu, C.T, Adams, B.L, Bauer, C.L, Casasent, D, Morawiec, A, Ozdemir, S, Talukder, A
• Format: Article
• Language: English
• Subjects: Condensed matter: structure, mechanical and thermal properties; Defects and impurities in crystals; microstructure; Electron backscatter diffraction patterns; Exact sciences and technology; Grain and twin boundaries; Instruments, apparatus, components and techniques common to several branches of physics and astronomy; Orientation imaging microscopy; Physics; Scanning probe microscopes, components and techniques; Structure of solids and liquids; crystallography; Triple junctions
• ISSN: 0304-3991; 1879-2723
• DOI: 10.1016/S0304-3991(02)00151-1

A new experimental approach to the quantitative characterization of polycrystalline microstructure by scanning electron microscopy is described. Combining automated electron backscattering diffraction with conventional scanning contrast imaging and with calibrated serial sectioning, the new method (mesoscale interface mapping system) recovers precision estimates of the 3D idealized aggregate function G( x). This function embodies a description of lattice phase and orientation (limiting resolution∼1°) at each point x (limiting spatial resolution∼100 nm), and, therefore, contains a complete mesoscale description of the interfacial network. The principal challenges of the method, achieving precise spatial registry between adjacent images and adequate distortion correction, are described. A description algorithm for control of the various components of the system is also provided.