BEM simulation of Wien filters

The boundary element method can provide accurate solutions to the electromagnetic problem in numerical simulations of electron optics devices. In this paper, we describe our approach, which applies a subsectional-bases method to generate a boundary division, representing the shape and behaviour of t...

Full description

Saved in:
Bibliographic Details
Published in:Ultramicroscopy 2002-12, Vol.93 (3), p.253-261
Main Authors: Martı́nez, G, Tsuno, K
Format: Article
Language:English
Subjects:
Aberration
Beam collimators, monochromators
Beam optics
Chromatic and geometrical aberrations
Electromagnetism
electron and ion optics
Electron trajectory
Electron, positron and ion microscopes, electron diffractometers and related techniques
Exact sciences and technology
Field calculation
Fundamental areas of phenomenology (including applications)
Instruments, apparatus, components and techniques common to several branches of physics and astronomy
Physics
Wien filter
Citations: Items that this one cites
Items that cite this one
Online Access:Get full text
Tags: Add Tag
No Tags, Be the first to tag this record!
Description
Summary:The boundary element method can provide accurate solutions to the electromagnetic problem in numerical simulations of electron optics devices. In this paper, we describe our approach, which applies a subsectional-bases method to generate a boundary division, representing the shape and behaviour of the Wien filter precisely. We investigate by direct ray tracing the origin of the second-order geometrical aberrations of this filter and propose new designs to reduce them.
ISSN:0304-3991
1879-2723
DOI:10.1016/S0304-3991(02)00282-6